Artur Jutman und Raimund Ubar - Info zur Person

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Proceedings of the Estonian Academy of Sciences, Engineering - Google...

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Estonian Acad. Sci. Eng., 2001, 7, 4, APPLICATION OF STRUCTURALLY SYNTHESIZED BINARY DECISION DIAGRAMS FOR TIMING SIMULATION OF DIGITAL CIRCUITS Artur JUTMAN and Raimund UBAR Computer Engineering Department, Tallinn Technical University, Raja 15, Tallinn, Estonia; {artur, ...

Comparative Analysis of Structured Design for Testability techniques

www.jetir.org

Web5.Devadze, Sergei, Jaan Raik, Artur Jutman, and Raimund Ubar. "Fault simulation with parallel critical path tracing for combinational circuits using SSBDDs." In IEEE LATW. …

Learning digital test and diagnostics via Internet

www.db-thueringen.de

WebRaimund Ubar, Artur Jutman, Margus Kruus, Elmet Orasson, Sergej Devadze, Heinz-Dietrich Wuttke Learning digital test and diagnostics via Internet Original published in: …

Proceedings - Fachgebiet Mikroelektronische Systeme – TU …

www.mes.tu-darmstadt.de

Web“E-Learning Environment for WEB-Based Study of Testing”, Raimund Ubar, Artur Jutman, Jaan Raik, Sergei Devadze, Maksim Jenihhin, Igor Aleksejev, Sergei Kostin, Anton …

Efficient Single-Pattern Fault Simulation on Structurally Synthesized...

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Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs. Authors; Authors and affiliations. Jaan Raik; Raimund Ubar; Sergei Devadze; Artur Jutman. Jaan Raik. 1. Raimund Ubar. 1. Sergei Devadze. 1. Artur Jutman Department of Computer EngineeringTallinn University of TechnologyTallinnEstonia.

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Parallel X-Fault Simulation with Critical Path Tracing

past.date-conference.com

WebRaimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman Department of Computer Engineering Tallinn University of Technology Tallinn, Estonia {raiub, serega, jaan, …

13th Asia and South Pacific Design Automation Conference (ASP-DAC...

www.aspdac.com

Author, *Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman (Tallinn Univ. of Tech., Estonia). Abstract, An improved method for calculation of fault coverage with parallel fault backtracing in digital circuits with scan path is proposed. The method is based on structurally synthesized BDDs (SSBDD) ...

Aciioeayoaeo

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... RPRPs in RIN based BIST", D.-S. Song, and S. Kang, Asia-Pacific Computer Systems Architecture Conference, LECT NOTES COMPUT SC 3740: , "Reseeding using Compaction of Pre-Generated LFSR Sub-Sequences", Artur Jutman, Igor Aleksejev, Jaan Raik, Raimund Ubar, ICECS 2008, pp

Proceedings of the Estonian Academy of Sciences

www.kirj.ee

Artur JUTMAN and Raimund UBAR. Abstract. Meeting the timing requirements is an important constraint imposed on highly integrated circuits, and the verification of timing of a circuit before manufacturing is one of the critical tasks to be solved by CAD tools. In this paper, we present a novel technique to speed up gate-level ...

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