Artur Jutman und Sergei Devadze - Info zur Person

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Languages, Design Methods, and Tools for Electronic System Design:...

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Designing Reliable Cyber-Physical Systems Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Goerschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Shlomit Koyfman, Jan Malburg, Shiri Moran, Jaan Raik, Gerard Rauwerda, Heinz Riener, Franz Röck, ...

AGRA - Publikationen - Mitarbeiterpublikationen

www.informatik.uni-bremen.de

Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon Ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert ...

Proceedings - Fachgebiet Mikroelektronische Systeme – TU …

www.mes.tu-darmstadt.de

Web“E-Learning Environment for WEB-Based Study of Testing”, Raimund Ubar, Artur Jutman, Jaan Raik, Sergei Devadze, Maksim Jenihhin, Igor Aleksejev, Sergei Kostin, Anton …

Efficient Single-Pattern Fault Simulation on Structurally Synthesized...

link.springer.com

Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs. Authors; Authors and affiliations. Jaan Raik; Raimund Ubar; Sergei Devadze; Artur Jutman. Jaan Raik. 1. Raimund Ubar. 1. Sergei Devadze. 1. Artur Jutman Department of Computer EngineeringTallinn University of TechnologyTallinnEstonia.

Designing Reliable Cyber-Physical Systems: Overview …

graz.pure.elsevier.com

WebGadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon ter Braak, Sergei Devadze, Goerschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkoff, Robert Könighofer ...

Parallel X-Fault Simulation with Critical Path Tracing

past.date-conference.com

WebRaimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman Department of Computer Engineering Tallinn University of Technology Tallinn, Estonia {raiub, serega, jaan, …

Publications | ES - TUHH

www.tuhh.de

WebGadi Aleksandrowicz and Eli Arbel and Roderick Bloem and Timon ter Braak and Sergei Devadze and Goerschwin Fey and Maksim Jenihhin and Artur Jutman and Hans G. …

13th Asia and South Pacific Design Automation Conference (ASP-DAC...

www.aspdac.com

Author, *Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman (Tallinn Univ. of Tech., Estonia). Abstract, An improved method for calculation of fault coverage with parallel fault backtracing in digital circuits with scan path is proposed. The method is based on structurally synthesized BDDs (SSBDD) ...

Memocode Hardware/Software Codesign Contest

memocode.irisa.fr

Rajarathinam M.A. Yupeng C. team uljana, Dept of Computer Engineering Tallinn University of Technology, Uljana Reinsalu Sergei Devadze Artur Jutman Anton Chertov. team brian, Brian Lindemann, Brian Lindemann. team vijay, AMD, VJ Sananda. team marco, Micro-lab. Politecnico di Milano, Italy, M. Branca L. Camerini

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