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SENTECH erweitert Anwendungsspektrum spektroskopischer Ellipsometer
www.adlershof.de
SENTECH Instruments GmbH gehört zu den führenden Anbietern von Dünnschichtmesstechnik, insbesondere von spektroskopischen Ellipsometern. Um die Leistung ihrer...
Netzwerk-Profile
Alle bøger af Bernd Bodermann - Saxo. Læs Lyt Lev
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Leder du efter bøger skrevet af Bernd Bodermann? SAXO.com har alle dine yndlingsforfattere. Find alle bøger af forfatteren Bernd Bodermann her.
OPUS 4 | Suchen
opus4.kobv.de
Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing (2015); Emil Agcos Bernd Bodermann Sven ...
Interessen
Bernd Bodermann - Patents
www.freshpatents.com
Recent bibliographic sampling of Bernd Bodermann patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title): ...
SPIE Optical Metrology to present advances in measurement and...
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Modeling Aspects in Optical Metrology, chair: Bernd Bodermann, Physikalisch-Technische Bundesanstalt: optical metrology modeling as a ...
Business-Profile
patentbuddy: Bernd Bodermann
BUNDESREPUBLIK DEUTSCHLAND, VERTR, DURCH DAS BUDESMINISTERIUM FUR WIRTSCHAFT UND TECHNOLOGIE, DIESES VERTRETEN DURCH DEN PRASIDENTEN DER PHYSIKALISCH-TECHNISCHEN BUNDESANSTALT
Private Homepages
Bernd Bodermann - Contact Details - EURAMET
www.euramet.org
Coordinator, Projecttype. Metrology of small structures for the manufacturing of electronic and optical devices, EMRP. Contact. E-Mail. .
Metrology of small structures for the …
www.ptb.de
Metrology of small structures for the manufacturing of electronic and optical devices Home; ... Dr. Bernd Bodermann . Physikalisch-Technische Bundesanstalt
Ausbildung
Modeling aspects in optical metrology V : June 2015, Munich,...
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Stanford Libraries' official online search tool for books, media, journals, databases, government documents and more.
Bücher
Automatische Sichtprüfung: Grundlagen, Methoden und Praxis der...
books.google.de
Das Lehrbuch behandelt systematisch die Bildgewinnung für die automatische Sichtprüfung. Die Autoren leiten die wesentlichen Methoden detailliert ab und...
Fringe 2013: 7th International Workshop on Advanced Optical Imaging...
books.google.de
Bernd Bodermann, Rainer Köning, Detlef Bergmann, Wolfgang Häßler-Grohne, Jens Flügge, and Harald Bosse Physikalisch-Technische Bundesanstalt ...
Interactions in Ultracold Gases: From Atoms to Molecules - Google...
books.google.de
Arising from a workshop, this book surveys the physics of ultracold atoms and molecules taking into consideration the latest research on ultracold phenomena,...
Dokumente zum Namen
Optical metrology for precision engineering in: Advanced Optical...
www.degruyter.com
Bernd Bodermann studied Physics at the university of Hannover, Germany with a focus on quantum optics, laser physics and optical frequency standards.
A 193nm microscope for CD metrology for the 32nm node and beyond,...
www.deepdyve.com
Bernd Bodermann. 1. , Zhi Li, Frank Pilarski, Detlef Bergmann. Physikalisch-Technische BundesanstaltD Braunschweig, Germany.
opus4.kobv.de
opus4.kobv.de
@inproceedings{AgcosBodermannBurgeretal.2015, author = {Emil Agcos and Bernd Bodermann and Sven Burger and Gaoliang Dai and Johannes Endres and Poul-Erik …
Roughness measurement methodology according to DIN using optical...
www.deepdyve.com
Modeling Aspects in Optical Metrology II, edited by Harald Bosse, Bernd Bodermann, Richard M. Silver,. Proc. of SPIE Vol , Z · © SPIE · CCC ...
Wissenschaftliche Veröffentlichungen
Projekt
univis.uni-erlangen.de
Dipl.-Phys. Johannes Trautner, Dipl.-Phys. Karl Walcher, Dipl.-Phys. Regis Danielian, Dipl.-Phys. Manfred Krauß, Dr. Bernd Bodermann Laufzeit:
Research project
univis.uni-erlangen.de
Dipl.-Phys. Johannes Trautner, Dipl.-Phys. Karl Walcher, Dipl.-Phys. Regis Danielian, Dipl.-Phys. Manfred Krauß, Dr. Bernd Bodermann Duration:
Veröffentlichungen allgemein
bol.com: Modeling Aspects in Optical Metrology III | | Bernd...
Modeling Aspects in Optical Metrology III. Modeling Aspects in Optical Metrology III is een boek van Bernd Bodermann
Bernd Bodermann
spie.org
SPIE Profile of Bernd Bodermann, Physikalisch Technische Bundesanstalt. SPIE Profiles is a networking platform for optics and photonics professionals.
The Road towards Accurate Optical Width Measurements at the...
link.springer.com
Bernd Bodermann · (2); Rainer Köning (2); Detlef Bergmann (2); Wolfgang Häßler-Grohne (2); Jens Flügge (2); Harald Bosse (2).
Image simulation of projection systems in photolithography | (2011) |...
spie.org
Modeling Aspects in Optical Metrology III, Bernd Bodermann, Editors, E ... The well-established Abbe formulation is one of to …
Artikel & Meinungen
PhD defence - Nikolaj Agentoft Feidenhans´l - DTU Nanotech
www.biointense.nu
Head of working group Optical Nanometrology Bernd Bodermann – PTB, Germany Technical Product Manager Anders Kühle, Image Metrology ...
Sonstiges
Burger, Dr. Sven | Zuse Institute Berlin (ZIB)
www.zib.de
Burger, Dr. Sven. Position: Staff. Room: Frank Scholze, Bernd Bodermann, Sven Burger, Johannes Endres, Anton Haase, Michael Krumrey, Christian Laubis, ...
4.23 Optical Nanometrology - PTB.de
www.ptb.de
Contact. Head of Working Group. Dr. Bernd Bodermann. Phone: + Email: bernd.bodermann(at)ptb.de. Address. Physikalisch-Technische ...
OPUS 4 | Determination of line profiles on photomasks using DUV, EUV...
opus4.kobv.de
Determination of line profiles on photomasks using DUV, EUV and X-ray scattering. Frank Scholze, Bernd Bodermann, Sven Burger, Johannes Endres, Anton Haase, ...
OPUS 4 | Scatterometry reference standards to improve tool matching...
opus4.kobv.de
... Bernd Bodermann, Sven Burger, Gaoliang Dai, Johannes Endres, Poul-Erik Hansen, Lars Nielson, Morten Madsen, Sebastian Heidenreich, Michael Krumrey, Bernd ...
Preliminary Comparison of DUV Scatterometry for CD and Edge Profile...
www.springerprofessional.de
Bernd Bodermann Gaoliang Dai Matthias Wurm Mark-Alexander Henn Hermann Gross Frank Scholze Alexander Diener . Verlag Springer Berlin Heidelberg Sequenznummer …
OPUS 4 | First steps towards a scatterometry reference standard
opus4.kobv.de
First steps towards a scatterometry reference standard. Bernd Bodermann, Poul-Erik Hansen, Sven Burger, Mark-Alexander Henn, Hermann Gross, Markus Bär, Frank …
Seminar on Ellipsometry and Reflectometry 2015
www.sentech.com
The Seminar on Ellipsometry & Reflectometry focussed on innovations of SENTECH metrology and new developments in science and technology.
Spectroscopic Ellipsometer for 16 Mueller Matrix Elements
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Spectroscopic Ellipsometer by SENTECH. Newly developed option allows spectroscopic ellipsometry for measure all 16 Mueller Matrix Elements!
businesspress24.com - SENTECH Seminar on Ellipsometry and...
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BusinessPress24 - international press and public relations portal featuring Free Press Release Distribution
The Road towards Accurate Optical Width Measurements at the...
www.springerprofessional.de
Dimensional metrology based on optical vision systems is commonly used at the industrial level, for example in optical coordinate measurement
Advantages of optoelectronic frequency control of laser diodes
www.spiedigitallibrary.org
SPIE Digital Library Proceedings
CiteSeerX — Evaluation of Scatterometry Tools for Critical Dimension...
citeseerx.ist.psu.edu
... Monitor Changes. by Matthias Wurm , Bernd Bodermann , Werner Mir ... author = {Matthias Wurm and Bernd Bodermann and Werner Mir}, title = {Evaluation of ...
Metrology capabilities and performance of the new DUV Scatterometer...
www.vde-verlag.de
23rd European Mask and Lithography Conference; Metrology capabilities and performance of the new DUV Scatterometer of the PTB
4.23 Optische Nanometrologie - PTB.de
www.ptb.de
E-Mail: Bernd Bodermann. Anschrift, Physikalisch-Technische Bundesanstalt Arbeitsgruppe Braunschweig ...
Modeling and Simulation of Complex Processes | Zuse Institute Berlin...
www.zib.de
Emil Agcos, Bernd Bodermann, Sven Burger, Gaoliang Dai, Johannes Endres, Poul-Erik Hansen, Lars Nielson, Morten Madsen, Sebastian Heidenreich, ...
Verhandlungen der Deutschen Physikalischen Gesellschaft
www.dpg-verhandlungen.de
... Mensing und Jürgen Helmcke. 16:30, Q , Modulation-free Rb-stabilised diode laser for interferometry — •Bernd Bodermann and Volker Burgarth.
Optical metrology for precision engineering - ProQuest
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Wei Gao* and Bernd Bodermann. Optical metrology for precision engineering. DOI aot Precision engineering is the discipline related to the ...
SPIE Optical Metrology 2011: Call for Papers | Business | Nov |...
www.photonics.com
New research in optical measurement technologies enabling applications in industry, research modeling, inspection of nanostructures and artwork, and r
Projekt
univis.fau.de
Manfred Krauß, Dr. Bernd Bodermann Laufzeit: Förderer: Deutsche Forschungsgemeinschaft. Publikationen. Trautner, Johannes ; Leuchs ...
Übersichtsartikel: Quantitative Mikroskopie und dimensionale...
docplayer.org
SPIE 4777, (2002) Bernd Bodermann, Winfried Michaelis, Alexander Diener, W. Mirandé: New methods for CD measurements on photomasks using dark field ...
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