Elham Moghaddam und Nilanjan Mukherjee - Info zur Person

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Conference Program | Design Automation Conference

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Elham Moghaddam - Mentor, A Siemens Business, Wilsonville, OR Nilanjan Mukherjee - Mentor, A Siemens Business, Wilsonville, OR Janusz Rajski - Mentor, A ...

SIN PP | Elham Moghaddamput.poznan.pl

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4. Embedded Deterministic Test Points / Cesar Acero, Derek Feltham, Yingdi Liu, Elham Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M.

Characterization of Locked Combinational Circuits via ATPGScholars Portal

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Hardware Protection via Logic Locking Test Points. Authors. Michael Chen · Elham Moghaddam · ORCID ID · Nilanjan Mukherjee · Janusz Rajski ...

Advanced VLSI Design and Testability Issuesgoogle.de

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Chen, Michael, Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, and Justyna Zawada. “Hardware protection via logic locking test points.

Elham Moghaddam

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Nilanjan Mukherjee, Benoit Nadeau-Dostie, more · Asian Test Symposium >

Embedded Deterministic Test PointsIEEE Computer Society

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von C Acero · · Zitiert von: 42 — ... The University of Iowa, Iowa City, IA, USA Elham Moghaddam , Mentor Graphics, Wilsonville, OR, USA Nilanjan Mukherjee , Mentor Graphics, Wilsonville, ...

Improved Pseudo-Random Fault Coverage Through ...Researcher App

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Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada. Unbookmark paper Bookmark paper.

Embedded deterministic test points for compact cell-aware tests

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Cesar Acero, Derek Feltham, Friedrich Hapke, Elham Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna ...

Scan Methodology and ATPG DFT Techniques at Lower ...www.ciitresearch.org › pdcs › view › PDCS

www.ciitresearch.org

Haluk Konuk, Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, and Justyna Zawada. Design for low test pattern counts.

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Janusz Rajski
Jerzy Tyszer
Cesar Acero

Nicole Mandrysch
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Maria Borgend

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Elham Moghaddam und Nilanjan Mukherjee Person-Info