Fritz Gliem und Martin Herrmann - Info zur Person

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(PDF) [IEEE IEEE Radiation Effects Data Workshop ...dokumen.tips

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Heavy Ion sensitivity of Gbit NAND-Flash and 4-Gbit DDR3 SDRAM Kai Gru¨rmann, Martin Herrmann, Fritz Gliem, Hagen Schmidt, Gilbert Leibeling, ... Heavy Ion sensitivity of Gbit NAND-Flash and 4-Gbit DDR3 SDRAM Kai Gru¨rmann, Martin Herrmann, Fritz Gliem, Hagen Schmidt, Gilbert Leibeling, ...

[IEEE th European Conference on Radiation and Its ...

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Heavy ion SEE test of 2 Gbit DDR3 SDRAM Martin Herrmann, Kai Grürmann, Fritz Gliem, Heikki Kettunen, and Véronique Ferlet-Cavrois Abstract—New generation › Documents

[IEEE IEEE Radiation Effects Data Workshop (REDW) (in...

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In-Situ TID Test of 4-Gbit DDR3 SDRAM DevicesMartin Herrmann, Kai Grrmann, Fritz Gliem, Hagen Schmidt, and Vronique Ferlet-CavroisAbstract4-Gbit DDR3 SDRAM...

[IEEE IEEE Radiation Effects Data Workshop (in conjunction with...

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Heavy Ion sensitivity of Gbit NAND-Flash and 4-Gbit DDR3 SDRAM Kai Gru¨rmann, Martin Herrmann, Fritz Gliem, Hagen Schmidt, Gilbert Leibeling, Heikki...

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ESA CNES Final Presentation Days ESCIES

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5-6 June ESA-ESTEC (The Netherlands) ; 27. Marta Bagatin. Univ. Padova ; 28. Kai Grürmann, Martin Herrmann, Fritz Gliem, Hagen Schmidt. IDA & EADS-Astrium June ESA-ESTEC (The Netherlands) ; 27. Marta Bagatin. Univ. Padova ; 28. Kai Grürmann, Martin Herrmann, Fritz Gliem, Hagen Schmidt. IDA & EADS-Astrium.