Heinrich Theodor Vierhaus und Jaan Raik - Info zur Person

(1 - 16 von 22

)

ESLAB | Dimitar Nikolov

www.ida.liu.se

Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: ...

Design and Test Technology for Dependable Systems-on- ...Z-Library Project

z-lib.io

Design and Test Technology for Dependable Systems-on-Chip. Raimund Ubar, Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus comments. Designing ... Design and Test Technology for Dependable Systems-on-Chip. Raimund Ubar, Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus comments. Designing ... Bewertung: 5 · ‎4 Ergebnisse Rezensionen werden von der Google Suche nicht überprüft

Design and Test Technology for Dependable Systems-on-chipgoogle.de

books.google.de

Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus. avoiding the usage of a faulty component. In the next section we will review self-repair approaches for ...

ESLAB | Publications - IDA.LiU.SELiU ▶ IDA

www.ida.liu.se

Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN:

AbeBooks: raimund ubar jaan raik heinrich theodor vierhaus - AbeBooks

DESIGN AND TEST TECHNOLOGY FOR DEPENDABLE SYSTEMS ON CHIP von UBAR und eine große Auswahl ähnlicher Bücher, Kunst und Sammlerstücke erhältlich auf AbeBooks.de.

Interdependent Challenges of Reliability, Security and ...arXiv

arxiv.org

von M Jenihhin · — ... Heinrich Theodor Vierhaus, Georgios Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert-Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni ... von M Jenihhin · — ... Heinrich Theodor Vierhaus, Georgios Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert-Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni ...

Study on Combined Test-Data Compression and Test Planning for Testing...

www.diva-portal.org

... [ed] Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, Information Science Publishing , 2010Chapter in book (Other academic) ...

dblp: Workshop on Design and Diagnostics of Electronic ...www.informatik.uni-trier.de › ddecs

dblp.uni-trier.de

Zoran Stamenkovic, Witold A. Pleskacz, Jaan Raik, Heinrich Theodor Vierhaus: 18th IEEE International Symposium on Design and Diagnostics of Electronic ...

AGRA - Publikationen - Buchbeträgewww.informatik.uni-bremen.de › agra › ger › buchbeitrag

www.informatik.uni-bremen.de

Herausgeber: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus. Buchtitel: Design and Test Technology for Dependable Systems-on-Chip. Verlag ...

AGRA - Publikationen - Mitarbeiterpublikationen

www.informatik.uni-bremen.de

Herausgeber: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus Combining Ordered Best-First Search with Branch and Bound for Exact BDD Minimization Marcio F. S. Oliveira, Christoph Kuznik, Wolfgang Mueller, Finn Haedicke, ...

Alle Infos zum Namen "Heinrich Theodor Vierhaus"

„Design and Test Technology for Dependable Systems-on- ...Google Play

play.google.com

Design and Test Technology for Dependable Systems-on-chip“ – el. knyga, kurią parašė Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus. Design and Test Technology for Dependable Systems-on-chip“ – el. knyga, kurią parašė Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus.

Design and test technology for dependable systems-on-chip - Missouri...

link.library.mst.edu

Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus. Resource Information. The item ...

Kaitstud ja kaitsmisele tulevad väitekirjad — Sirp

www.sirp.ee

http://digi.lib.ttu.ee/i/?803. Kaitsmine toimub reedel, 30. novembril kl 10 Tallinnas TTÜ Arvutitehnika Instituudi ruumis IT Juhendaja: prof Jaan Raik Oponendid: prof Heinrich Theodor Vierhaus (Brandenburgi Tehnikaülikool, Saksamaa) ja prof Matteo Sonza Reorda (Torino Polütehniline Ülikool, Itaalia).