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[PDF] Anisotropy of the resistivity and charge-carrier sign in ...dial.uclouvain.be › boreal: › datastream › PDF_01 › view
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AP · Eklund, J. Emmerlich, H. Högberg, T. Meehan,. P. Finkel, M. W. Barsoum, J. D. Hettinger, L. Hultman, and S. E..
Ausbildung
Synthesis of MAX Phases in the Ti 2 AlC–V 2 AlC System as ...journals.scholarsportal.info › 705_sompitpohmtx
journals.scholarsportal.info
T.H. Scabarozi · P. Eklund · J. Emmerlich · H. Hogberg · T. Meehan · P. Finkel · M.W. Barsoum · J.D. Hettinger ...
Bücher
Defect-engineered (Ti,Al)N thin filmsbooks.google.com › books
books.google.com
H. Högberg, L. Hultman, J. Emmerlich, T. Joelsson, P. Eklund, J. M. MolinaAldareguia, J. P. Palmquist, O. Wilhelmsson, and U. Jansson, ...
Advances in Science and Technology of Mn+1AXn Phases - Google Books
books.google.com.ua
Advances in Science and Technology of Mn+1AXn Phases presents a comprehensive review of synthesis, microstructures, properties, ab-initio calculations and...
Defect-engineered (Ti,Al)N thin films - Isabella Citlalli Schramm...
books.google.hr
[42] [43] [44] [45] [46] [47] [48] [49] [50] [51] [52] [53] [54] [55] [56] [57] J. Emmerlich , D. Music, P. Eklund, O. Wilhelmsson, U. Jansson, J. M. Schneider, H. Högberg ...
Mechanical Properties and Performance of Engineering Ceramics II,...
books.google.hr
This volume contains over 70 papers on advanced research and development of processing, mechanical properties and mechanics of ceramics and composites from the...
Dokumente zum Namen
[PDF] Electronic structure investigation of Ti3AlC2, Ti3SiC2, and Ti3GeC2 ...www.diva-portal.org › smash › get › diva2: › FULLTEXT01
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M. Magnuson,1 J.-P. Palmquist,2 M. Mattesini,1,4 S. Li,1 R. Ahuja,1 O. Eriksson,1 J. Emmerlich,3 O. Wilhelmsson,2. P. Eklund,3 H. Högberg,3 L. Hultman,3 and ...
Electronic structure investigation of Ti3AlC2, Ti3SiC2, and Ti3GeC2 ...arxiv.org › cond-mat
arxiv.org
AP · Authors:M. Magnuson, J. -P. Palmquist, M. Mattesini, S. Li, R. Ahuja, O. Eriksson, J. Emmerlich, O. Wilhelmsson, P. Eklund, H. Högberg, ...
[PDF] Epitaxial growth of γ-Al2O3 on Ti2AlC(0001) by reactive high-power ...cyberleninka.org › article
cyberleninka.org
AP · 12 P. Eklund, C. Virojanadara, J. Emmerlich, L. I. Johansson, H. Högberg, and L. Hultman, Phys. Rev. B 74, (2006).
[PDF] High-pressure phase stability, mechanical properties and bonding ...kd.nsfc.gov.cn › paperDownload
kd.nsfc.gov.cn
AP · Eklund, J. Emmerlich, J. Birch, L. Hultman, J. Mater. Res (2005) 779.
Wissenschaftliche Veröffentlichungen
Max-Planck-Fellow-Gruppe: Self-Reporting Materials - Deutschwww.mch.rwth-aachen.de › cms › MCH › Forschung › ~ktpc › Max-Planc...
www.mch.rwth-aachen.de
AP · J. Emmerlich, D. Music, M. Braun, P. Fayek, F. Munnik and J.M. Schneider, 'A proposal for an unusually stiff and moderately ductile hard ...
Weak electronic anisotropy in the layered nanolaminate Ti 2 GeCwww.sciencedirect.com › science › article › abs › pii
www.sciencedirect.com
J. Emmerlich et al. J. Appl. Phys. (2004). H.
Study on Structural, Electronic, Optical and Mechanical Properties of ...www.sciencepublishinggroup.com › paperinfo › j.aj...
www.sciencepublishinggroup.com
AP · Eklund, J. Emmerlich, et al., J. Mater. Res., 20, 779 (2005). [14].
Thin Solid Films | Vol 497, Issues 1–2, Pages (21 February...
www.sciencedirect.com
H. Riascos, J. Neidhardt, G.Z. Radnóczi, J. Emmerlich, ... P. Prieto. Pages 1-6: Download PDF. Article preview. select article Determination of the doping ...
Veröffentlichungen allgemein
Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films ...link.springer.com › Journal of Materials Research
link.springer.com
AP · J. Emmerlich, J-P. Palmquist, H. Högberg, J.M. Molina-Aldareguia, Zs. Czigány, Sz. Sasvári, P.O.Å. Persson, U.
(PDF) Synthesis and ab initio calculations of nanolaminated (Cr,Mn ...www.researchgate.net › publication
www.researchgate.net
Shang, J. Emmerlich, and J. M. Schneider, Acta Mater.
Effect of HPPMS Pulse-Frequency on Plasma Discharge and Deposited...
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View at Publisher · View at Google Scholar · View at Scopus; J. Emmerlich, S. Mráz, R. Snyders, K. Jiang, and J. M. Schneider, “The physical ...
Comment on “Pulsed Laser Deposition and Properties of M n+1AX x Phase...
link.springer.com
A recent paper by Hu et al. claimed synthesis of the MAX-phase Ti3SiC2at 100–300 °C using pulsed laser deposition. In this comment, we find that
Artikel & Meinungen
Wikipedia: Hochleistungsimpulsmagnetronsputtern – Wikipedia
Das Hochenergieimpulsmagnetronsputtern (englisch high power impulse magnetron J. Alami, P. Eklund, J. Emmerlich, O. Wilhelmsson, U. Jansson, H. Högberg, L. Hultman, U. Helmersson: High-power impulse magnetron sputtering of ...
Sonstiges
Dr. rer. nat. Aurelija Mockuté - Materials Discovery and Interfaceswww.mdi.ruhr-uni-bochum.de › mockute.html.de
www.mdi.ruhr-uni-bochum.de
AP · A. Mockute, M. Dahlqvist, J. Emmerlich, L. Hultman, J.M. Schneider, P.O.Å. Persson, J. Rosen (2013) Synthesis and ab initio calculations of ...
Biomimetic Soft Wings for Soft Robot Science - Fuji Technology Presswww.fujipress.jp › jrm › robot
www.fujipress.jp
Bachmann, J. Emmerlich, W. Baumgartner, J. M. Schneider, and H. Wagner, “Flexural stiffness of feather shafts: geometry rules over material properties,” J.
Effect of Si and C concentration on the microstructure, and the ...aip.scitation.org › doi › abs
aip.scitation.org
J. Alami, P. Eklund, J. Emmerlich, O. Wilhelmsson, U. Jansson, H. Hogberg, L. Hultman, and U. Helmersson, Thin Solid Films 515, (2006).
Emmerlich tütet den Sieg für den SV Salamander myTischtenniswww.mytischtennis.de › clicktt › bericht-zum-spiel › TTV-Er...
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Doppel: Otzelberger Lerchundi / Krause 1:0, Emmerlich / Sfatkidis 1:0. Einzel: J. Emmerlich 2:0, P. Lerchundi 0:1, M. Sfatkidis 1:0, F. Krause 1:0.
Growth and characterization of MAX-phase thin films - Academia.eduwww.academia.edu › Growth_and_characterization_...
www.academia.edu
Persson, J. Emmerlich, O. Wilhelmsson, H. Hfgberg, M. Katsnelsson, B. Johansson, R. Ahuja, O. Eriksson, L. [1] ...
Influence of Substrate Temperature on the TiC Thin Films Prepared ...koreascience.kr › article › JAKO
koreascience.kr
https://doi.org s ; P. Eklund, J. Emmerlich, H. Hogberg, O. Wilhelmsson, P. Isberg, J. Birch, P.O.Å. Persson, U. Jansson, ...
Interfacial structure of V(2)AlC thin films deposited on (11(2)over-bar0)ir.imr.ac.cn › handle
ir.imr.ac.cn
Scripta Materialia,2011,64(4): APA, D. P. Sigumonrong.,J. Zhang.,Y. C. Zhou.,D. Music.,J. Emmerlich.,...
Kommunizierende Materialien - Max-Planck-Institut für Eisenforschungwww.mpie.de › Forschung
www.mpie.de
J. Emmerlich, D. Music, M. Braun, P. Fayek, F. Munnik and J.M. Schneider, 'A proposal for an unusually stiff and… [mehr] moderately ductile hard coating ...
Niobium thin film thickness profile tailoring on complex shape ...inspirehep.net › literature
inspirehep.net
The physical reason for the apparently low deposition rate during high-power pulsed magnetron sputtering. J. Emmerlich. ,. S. Mráz.
Ohne Titelhal.inria.fr › html_references
hal.inria.fr
M. Baben, L. Shang, J. Emmerlich, and J. M. Schneider, Oxygen incorporation in M 2 AlC, vol.60, pp , J. Y. Wang, Y. C. Zhou, T. Liao, ...
Per Eklund: H-index & Awards - Academic Profile | Research.comresearch.com › Materials Science
research.com
Ola Wilhelmsson;Jens-Petter Palmquist;Erik Lewin;J. Emmerlich. Journal of Crystal Growth (2006) Citations. Element Replacement Approach by Reaction ...
Phys. Rev. B 70, (2004) - ${M}_{n+1}A{X}_{n}$ phases in ...link.aps.org › doi › PhysRevB
link.aps.org
AP · J.-P. Palmquist, S. Li, P. O. Å. Persson, J. Emmerlich, O. Wilhelmsson, H. Högberg, M. I. Katsnelson, B. Johansson, R. Ahuja, O. Eriksson, L.
Structure and Properties of Pulsed-Laser Deposited Carbon Nitride ...pure.unileoben.ac.at › portal › publications
pure.unileoben.ac.at
Structure and Properties of Pulsed-Laser Deposited Carbon Nitride Thin Films. H. Riascos, Jörg Neidhardt, G.Z. Radnoczi, J. Emmerlich, G. Zambrano, Lars Hultman ...
Systematic study on the pressure dependence of ${M}_{2}\mathrm ...link.aps.org › doi › PhysRevB
link.aps.org
J. Emmerlich, D. Music, A. Houben, R. Dronskowski, and J. M. Schneider. Phys. Rev. B 76, – Published 21 December
Tribological performance evidence on ternary and quaternary nitride ...www.scielo.org.mx › scielo
www.scielo.org.mx
H. Riascos, J. Neidhardt, G.Z. Radnoczi, J. Emmerlich, G. Zambrano, L. Hultman, and P. Prieto, Thin Solid Films 497 (2006) 1. [ Links ].
[PDF] Growth and characterization of epitaxial Ti3GeC2 thin films on 4H ...www.tara.tcd.ie › bitstream › handle
www.tara.tcd.ie
AP · Eklund, J. Emmerlich, H. Högberg, T. Meehan, P. Finkel,. M.W. Barsoum, J.D. Hettinger, L. Hultman, S.E. Lofland, Solid ...
[PDF] Optical properties of Ti3SiC2 and Ti4AlN3 - VCU Scholars Compassscholarscompass.vcu.edu › cgi › viewcontent
scholarscompass.vcu.edu
Persson, J. Emmerlich, O. Wilhelmsson, H. Hogberg, M. I. Katsnelson, B. Johansson, R. Ahuja, O. Eriksson, L ...
[PDF] Phase stability of epitaxially grown Ti2AlN thin films - HZDRwww.hzdr.de › FWI › Jahresbericht › Beckers
www.hzdr.de
Seppänen, J.-P. Palmquist, P. O. Å. Persson, J. Emmerlich, J. Molina, J. Birch, U. Jansson, P. Isberg, and L. Hultman, in Proceedings of the 53rd.
grupo de investigación sismicidad, sismotectónica y riesgo sísmicowww.ucm.es › gsismo › publicaciones
www.ucm.es
Eriksson, J. Emmerlich, O. Wilhelmsson, P. Eklund, H. Högberg, L. Hultman, and U. Jansson (2005). Electronic structure investigation of ...
Conductive nanocomposite ceramics as tribological and electrical ...
www.epjap.org
100, (2006) [CrossRef] [Google Scholar]; P. Eklund, J. Emmerlich, H. Högberg, O. Wilhelmsson, P. Isberg, J. Birch, P.O. Å. Persson, U. Jansson, ...
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