J. Keckes und Daniel - Info zur Person

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International Conference on Residual Stresses 9 (ICRS 9) - Google...

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[3] R. Daniel, K. Martinschitz, J. Keckes and C. Mitterer: The origin of stresses in magnetronsputtered thin films with zone T structures, Acta Mater., Vol. 58 (2010) ...

[ ] Complementary ab initio and X-ray nano-diffraction study...

arxiv.org

Authors:R. Hollerweger, D. Holec, J. Paulitsch, M. Bartosik, R. Daniel, R. Rachbauer, P. Polcik, J. Keckes, C. Krywka, P. H. Mayrhofer.

Thermal expansion of Ti-Al-N and Cr-Al-N coatings - ScienceDirect

www.sciencedirect.com

M. Bartosik, R. Daniel, Z. Zhang, M. Deluca, W. Ecker, M. Stefenelli, M. Klaus, C. Genzel, C. Mitterer, J. Keckes. Surf. Coat. Technol., 206 (2012) ...

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TiO2 composite coating by pack cementation process and ...coek.info › ...

coek.info

[16] C. Kirchlechner, K.J. Martinschitz, R. Daniel, C. Mitterer, J. Keckes, Residual stresses in thermally cycled CrN coatings on steel, Thin Solid Films ...

(IUCr) Elastic constants of fibre-textured thin films determined by...

scripts.iucr.org

K. J. Martinschitz, R. Daniel, C. Mitterer and J. Keckes. aDepartment of Materials Physics, University of Leoben and Erich Schmid Institute for Materials Science, ...

Influence of pulsed bias duty cycle variations on structural and...

coek.info

(2015), doi: j.surfcoat This is a PDF ... [43] R. Brill, F. Koch, J. Mazurelle, D. Levchuk, M. Balden, Y. Yamada-Takamura, H. Maier, H [47] R. Daniel, K.J. Martinschitz, J. Keckes, C. Mitterer, Acta Mater.

Publikationen | ÖGV – Österreichische Gesellschaft für Vakuumtechnik

www.oegv.or.at

Übersichtsvortrag zur Charakterisierung von Hartstoffschichten mit modernen Methoden, M. Tkadletz, N. Schalk, R. Daniel, J. Keckes, C. Czettl, C. Mitterer ...

Kirklareli University Journal of Engineering and Science »...

dergipark.org.tr

[23] R. Daniel, D. Holec, M. Bartosik, J. Keckes, C. Mitterer, 'Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured ...

Télécharger - Archive ouverte HAL

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R. Daniel, K. J. Martinschitz, J. Keckes, and C. Mitterer, The origin of stresses in magnetron-sputtered thin films with zone T structures, Acta Materialia, vol.58, ...

X-ray nanodiffraction analysis of stress oscillations in a W thin ...scripts.iucr.org › cgi-bin › paper

scripts.iucr.org

J. Todt, H. Hammer, B. Sartory, M. Burghammer, J. Kraft, R. Daniel, J. Keckes and S. Defregger. aDepartment of Materials Physics, Montanuniversität Leoben, ...

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