Chalcogenides: Metastability and Phase Change Phenomenagoogle.de
books.google.de
A.V. Kolobov, P. Fons, A.I. Frenkel, A.L. Ankudinov, J. Tominaga, T. Uruga, Nature Mater. 3, 703 (2004) 2. A.V. Kolobov, A.S. Mishchenko, P. Fons, ...
Chalcogenides: Metastability and Phase Change Phenomena - Alexander...
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A.V. Kolobov, A.S. Mishchenko, P. Fons, S.M. Yakubenya, J. Tominaga, J. Phys. Condens. Matter 19, (2007) 3. J.L.F. Da Silva, A. Walsh, S.H. Wei, ...
Springer Handbook of Electronic and Photonic Materialsgoogle.de
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89, (2006) K.V. Mitrofanov, A.V. Kolobov, P. Fons, X. Wang, J. Tominaga, Y. Tamenori, T. Uruga, N. Ciocchini, ...
The Design and Application on Interfacial Phase‐Change ...John Wiley
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von J Tominaga · · Zitiert von: 36 — .jp. Systematic Materials Design Group, Nanoelectronic Research Institute, National Institute of Advanced Industrial ... von J Tominaga · · Zitiert von: 180 — Rev. Lett , 21, R. E. Simpson, P. Fons, A. V. Kolobov, T. Fukaya, M. Krbal, T. Yagi, J. Tominaga, Nat. Nanotechnol , 6, H ...
Anomalous phase change process in [(GeTe)2/(Sb2Te3)]20 superlattice...
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... superlattice observed by coherent phonon spectroscopy. K. Makino, Y. Saito, K. Mitrofanov, J. Tominaga, A. V. Kolobov, T. Nakano, P. Fons, and M. Hase.
Phys. Rev. B 94, (2016) - Electronic excitation-induced...
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Electronic excitation-induced semiconductor-to-metal transition in monolayer MoTe2. A. V. Kolobov, P. Fons, and J. Tominaga. Phys. Rev. B
LOCAL STRUCTURE OF Ge-Sb-Te AND ITS ...Forum of chalcogeniders
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von AV Kolobov · · Zitiert von: 37 — A. V. Kolobov*, P. Fons, J. Tominaga, A. I. Frenkela, A. L. Ankudinovb, T. Urugac. Center for Applied Near-Field Optics Research, National Institute of ...
iDEP MRS Bulletin - RWTH PublicationsRWTH-Aachen
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A. V. Kolobov, P. Fons, A. I. Frenkel, A. L. Ankudinov, J. Tominaga, T. Uruga, Nat. Mater HegedXࡇs, S. R. Elliott, J. Tominaga, Appl. Phys. Lett.
Dynamic Response studies of GeTe devices for memory ...ScienceDirect
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von BG Sangeetha · · Zitiert von: 3 — J. Tominaga, A.V. Kolobov, P.J. Fons, X. Wang, Y. Saito, T. Nakano, M. Hase, S. Murakami, J. Herfort, Y. Takagaki. Sci. Technol. Adv. Mater., 16 ( ) ...
Understanding Phase-Change Memory Alloys from a ...Nature Journal
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von AV Kolobov · · Zitiert von: 53 — Understanding Phase-Change Memory Alloys from a Chemical Perspective. A.V. Kolobov,; P. Fons &; J. Tominaga. Scientific Reports volume 5, ...
Alle Infos zum Namen "J. Tominaga"
Crystalline GeTe-based phase-change alloys: Disorder in orderAcademia.edu
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12 .jp M. Krbal, A. V. Kolobov, P. Fons, J. Tominaga, S. R. Elliott, 1 Phase Change Materials: Science and Applications, ...
Interface effect and stress effect on Ge2Sb2Te5/Sb superlattice-like ...
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22, (2011) [CrossRef] [Google Scholar]; R.E. Simpson, P. Fons, A.V. Kolobov, T. Fukaya, M. Krbal, T. Yagi, J. Tominaga, Nat. Nanotechnol. 6, 501 (2011) ...
Phase segregation in Pb:GeSbTe chalcogenide systemThe European Physical Journal Applied Physics
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9, G259 (2006) [CrossRef] [Google Scholar]; A.V. Kolobov, P. Fons, J. Tominaga, A.I. Frenkel, A.L. Ankudinov, S.N. Yannopoulous, K.S. Andrikopoulos, ...
Local structure of amorphous Ge-Sb-Te alloys: Ge umbrella flip vs....
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Local structure of amorphous Ge-Sb-Te alloys: Ge umbrella flip vs. DFT simulations. A. V. Kolobov, P. Fons, J. Tominaga. Research output: Contribution to ...
R. A. Castro-Arata, V. M. Stozharov, D. M. Dolginsev, A. A. ...mathnet.ru
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von RA Kastro · — Saito, P. Fons, J. Tominaga, N. I. Anisimova, A. V. Kolobov, “Structural and dielectric study of thin amorphous layers of the Ge–Sb–Te system prepared by RF ...
Soft X-ray XANES of N in ZnO:N - Why is doping so difficult?Elsevier
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P. Fons, H. Tampo, S. Niki, A. V. Kolobov, M. Ohkubo, J. Tominaga, S. Friedrich, R. Carboni, F. Boscherini. Research output: Contribution to journal ...
Strain engineering of atomic and electronic structures of few ...American Physical Society
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von AV Kolobov · · Zitiert von: 21 — Strain engineering of atomic and electronic structures of few-monolayer-thick GaN. A. V. Kolobov, P. Fons, Y. Saito, J. Tominaga, B. Hyot, ...
Structural and Dielectric Study of Thin Amorphous Layers of ...www.springerprofessional.de › structural-and-dielectric...
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Autoren: R. A. Castro-Arata, V. M. Stozharov, D. M. Dolginsev, A. A. Kononov, Y. Saito, P. Fons, J. Tominaga, N. I. Anisimova, A. V. Kolobov.
Vol. 15, Number 5-6, Issue May-June 2013, Year 2013inoe.ro
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V. VEIKO , E. AGEEV , A.V. KOLOBOV , J. TOMINAGA Journal of Optoelectronics and Advanced Materials Vol. 15, Iss. 5-6, pp (2013).
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