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Phoenix Contact Gmbh x26 Co Kg patent inventors (2015)
stks.freshpatents.com
Hans-peter Hudetz · Hartmut Henkel · Heinrich Heise · Heinz Reibke · Heinz-w. Meier · Henning Heutger · Holger Steinhage · Hubertus Lohre · Jan-erik Schmutz.
Bücher
Bharat Bhushan (eds.)VDOC.PUB
vdoc.pub
Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer (auth.), Bharat Bhushan (eds.) 10,630; 4,965. Preview Document ...
Scanning Probe Microscopy in Nanoscience and Ellibsellibs.com
www.ellibs.com
Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer, Boris Anczykowski. 2. Photonic Force Microscopy: From Femtonewton Force Sensing to ...
Scanning Probe Microscopy of Functional Materials | Ebook ...
www.ellibs.com
Hendrik Hölscher, Jan-Erik Schmutz, Udo D. Schwarz. 4. Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy ...
Scanning Probe Microscopy in Nanoscience and Nanotechnologygoogle.be
books.google.be
1 Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, ...
Dokumente zum Namen
Single-Nanoparticle-Terminated Tips for Scanning Probe ...American Chemical Society
pubs.acs.org
von IU Vakarelski · · Zitiert von: 100 — 2008,,, https://doi.org B ; Jan-Erik Schmutz, Marcus M. Schäfer, Hendrik Hölscher.
H:\Datalogger\DataloggerMain.asmMikrocontroller.net
www.mikrocontroller.net
Version 1.2 by Jan-Erik Schmutz. ;. ;. ;. ; letzte Änderung ;
(O) Overview of Invited Talks and Sessions - The NOMAD ...th.fhi-berlin.mpg.de › DPG-FV-O-2008_program
th.fhi-berlin.mpg.de
•Jan-Erik Schmutz, Marcus M. Schäfer, and Hendrik Hölscher. — CeNTech, Universität MünsterMünster,. Germany. In some areas of ...
Veröffentlichungen allgemein
O - DPG-VerhandlungenYumpu
www.yumpu.com
— •Jens Falter, Jan-Erik Schmutz, Daniel. Ebeling, Marcus Schäfer und Hendrik Hölscher — Center for.
Dynamic Force Microscopy and Spectroscopy Using the ...Springer
link.springer.com
von H Hölscher · · Zitiert von: 1 — Daniel Ebeling & Jan-Erik Schmutz. nanoAnalytics GmbH, Münster, Germany. Marcus M. Schäefer.
Scanning Probe Microscopy of Functional Materials | SpringerLink
link.springer.com
Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications. Hendrik Hölscher, Jan-Erik Schmutz, Udo D. Schwarz. Pages
Sonstiges
DE B4 - Funkenstrecke Google Patents
patents.google.com
Other languages: German: English; Inventor: Rainer Durth: Jan-Erik Schmutz: Viktor Okel; Current Assignee. The listed assignees may be inaccurate.
US B2 - Multi-contact element for a varistor Google...
patents.google.com
Inventors, Jan-Erik Schmutz, Friedrich-Eckhard Brand. Original Assignee, Phoenix Contact Gmbh & Co. Kg. Export Citation, BiBTeX, EndNote, ...
WO A1 - Colloid-sensor for afm Google Patents
patents.google.com
Download PDF Find Prior Art Similar. Other languages: English: French; Inventor: Marcus Matthias SCHÄFER: Jan-Erik Schmutz: Hendrik Hölscher ...
Jan-Erik Schmutz
www.infona.pl
Search results for: Jan-Erik Schmutz ... Hendrik Hölscher, Jan-Erik Schmutz, Udo Schwarz · Scanning Probe Microscopy of Functional Materials > Dynamic ...
(eltako|1s9|220v) Suche Elektroforum
www.transistornet.de
Ich würde mich sehr über Hilfe freuen Jan-Erik Schmutz. von madman_phy-tech am Dienstag 1. August 2006, 11:27 Forum: Fragen zur Elektronik Thema ...
Colloid probes with increased tip height for higher ...National Institutes of Health (.gov)
pubmed.ncbi.nlm.nih.gov
von JE Schmutz · · Zitiert von: 9 — Authors. Jan-Erik Schmutz , Marcus M Schäfer, Hendrik Hölscher. Affiliation. 1 Center for Nanotechnology (CeNTech)Münster, ...
2 nd International Workshop on Advanced Atomic Force ...docplayer.net › nd-in...
docplayer.net
... Dynamic Force Microscopy Tobias Meier 1, Özhan Ünverdi 1, Jan-Erik Schmutz 2 and Hendrik Hölscher 1 1 Karlsruhe Institute of Technology (KIT), Germany, ...
Hochspannungsverstärker Elektroforum
www.transistornet.de
- Hochspannungsverstärker im Elektroforum - Fragen zu Elektronik und Elektro allgemein.Fragen zu Bauteilen wie z.B. Tansistoren, Dioden, Kondensatoren usw
Tribology Research References Quarterly Update- vol. 4, 2010atelim.com
atelim.com
— Jan-Erik Schmutz, Harald Fuchs, Hendrik Holscher, Measuring wear by combining friction force and dynamic force microscopy.
Verhandlungen der Deutschen Physikalischen Gesellschaft
www.dpg-verhandlungen.de
17:30, O 59.5, Wear measurement by friction force and dynamic force microscopy — Özhan Ünverdi, •Tobias Meier, Jan-Erik Schmutz, and ...
Scanning Probe Microscopy of Functional Materials - 微米纳米 - 小木虫 - 学术...
muchong.com
ScanningProbeMicroscopyofFunctionalMaterials----NanoscaleImagingandSpectroscopy_Kalinin,Sergei,Gruverman,Alexei_2010PartISpectroscopicSPMattheResolutionLimits1E...
Scanning Probe Microscopy of Functional Materials ...epdf.pub › scanning-probe-micros...
epdf.tips
Hendrik Hölscher, Jan-Erik Schmutz, and Udo D. Schwarz Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy ...
Schmutz - Patent applicationswww.patentsencyclopedia.com › sc...
www.patentsencyclopedia.com
Jan-Erik Schmutz, Detmold DE. Patent application number, Description, Published , SURGE ARRESTER - A surge arrester for use in the power ...
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