pdf - Durham Research Online
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von B Tanner · · Zitiert von: 5 — Brian K. Tanner 1, David Allen 2, Jochen Wittge 3, Andreas N. Danilewsky 4, Jorge Garagorri 5,. Eider Gorostegui-Colinas 6 ID , M. Reyes ... › ...
Diamond Publications - Search Results
publications.diamond.ac.uk
6 items — Brian K. Tanner , David Allen , Jochen Wittge , Dany Danilewsky , Jorge Garagorri , Eider Gorostegui-Colinas , M. Reyes Elizalde , Patrick J. Mcnally. › ...
LIBRARY - Ajman University
library.ajman.ac.ae
Authors : Brian K. Tanner; David Allen; Jochen Wittge. Subjects: X-ray diffraction imaging; Raman spectroscopy; indentation geometry. › eds
Crystal Indentation Hardness - Seite Google Books-Ergebnisseite
books.google.co.uk
... David Allen and Jochen Wittge undertook X-ray diffraction imaging experiments; and Brian K. Tanner wrote the first draft of the paper.
Dissertation_Roeth.pdf
opendata.uni-halle.de
von AR Von Julius · — [DWK+13] Andreas Danilewsky, Jochen Wittge, Konstantin Kiefl, David Allen, Pa- trick McNally, Jorge Garagorri, M. Reyes Elizalde, ... › bitstream › Disserta...
Orientation Dependence of Fracture Toughness and J-Stage
www.jstage.jst.go.jp
Brian Tanner, David Allen, Jochen Wittge, et al. Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in ... › _article
Strain Fields and Defects in Silicon Wafers Induced by ...
freidok.uni-freiburg.de
von ZJ Li — Bower, Jochen Wittge, Justus Tonn., David Allen, D. Jacques. Their assistances in my doctoral work are highly appreciated. Dr. Tao Liu, Dr. Ralf. Hofmann and Dr ... › FILE1 › content
bevel edge Latest Research Papers | ScienceGate
www.sciencegate.app
preprints v1 ◽ ◽. Author(s):. Brian K. Tanner ◽. David Allen ◽. Jochen Wittge ◽. Andreas N. Danilewsky ◽. Jorge Garagorri ◽. › key...
this document. - DCU - Yumpu
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— Silicon”, David Allen, Jochen Wittge, Jennifer Stopford, Andreas Danilewsky and. Patrick McNally, J. Appl. Cryst., 44, pp. 526–531 (2011). › view › t...
Alle Infos zum Namen "Jochen Wittge"
David Allen, Jochen Wittge, Jennifer Stopford, Andreas Danilewsky and...
docplayer.net
Journal of Applied Crystallography ISSN Editor: Anke R. Kaysser-Pyzalla Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in ...
+1,9 MM articles scientifics and academics - XJournals
xjournals.com
Brian K. Tanner, David Allen, Jochen Wittge, Andreas N. Danilewsky, Jorge Garagorri, Eider Gorostegui-Colinas, M. Reyes Elizalde and Patrick J. McNally. › Default
Crack propagation and fracture in silicon wafers PubMed
pubmed.ncbi.nlm.nih.gov
von A Danilewsky · · Zitiert von: 31 — Andreas Danilewsky , Jochen Wittge, Konstantin Kiefl, David Allen, Patrick McNally, Jorge Garagorri, M Reyes Elizalde, Tilo Baumbach, ... › ...
Create a SciFeed alert for new publications - MDPI
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Jochen Wittge. Andreas N. Danilewsky. Jorge Garagorri. Eider Gorostegui-Colinas. M. Reyes Elizalde. Patrick J. McNally ... von BK Tanner · · Zitiert von: 5 — ... of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon. by. Brian K. Tanner. 1,. David Allen. 2,. Jochen Wittge. 3,. › scifeed_di... › ...
Non-destructive X-Ray mapping of strain & warpage of die in ...
researchportal.hw.ac.uk
von J Stopford · · Zitiert von: 5 — Jennifer Stopford*, Arthur Henry, Dionysios Manessis, Nick Bennett, Ken Horan, David Allen, Jochen Wittge, Lars Boettcher, Aidan Cowley, Patrick McNally. › n...
Quantitative Imaging of the Stress/Strain Fields and Preprints
www.preprints.org
von BK Tanner · · Zitiert von: 5 — ... the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon. Brian K. Tanner. ,. David Allen. ,. Jochen Wittge. › manus...
Three-dimensional X-ray diffraction imaging of process ...
cyberleninka.org
Similar topics of scientific paper in Chemical engineering , author of scholarly article — David Allen, Jochen Wittge, Jennifer Stopford, Andreas Danilewsky ... › article
[PDF] X-ray diffraction and imaging | Semantic Scholar
www.semanticscholar.org
@inproceedings{Wittge2016XrayDA, title={X-ray diffraction and imaging}, author={Jochen Wittge and Konstantin Kiefl and David Allen and Patrick and McNally ... › ...
硅中压痕的应力/应变场的定量成像和宏观裂纹的产生,Crystals
www.x-mol.com
— Brian Tanner , David Allen , Jochen Wittge , Andreas Danilewsky , Jorge Garagorri , Eider Gorostegui-Colinas , M. Elizalde , Patrick McNally. › paper
Verwandte Suchanfragen zu Jochen Wittge
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