News
ESREF Oral Presentations Wed
conference.vde.com
Dietmar Vogel 1, Ellen Auerswald 1, Juergen Auersperg 1, Parisa Bayat 2, Raul Rodriguez 2, Dietrich Zahn 2, Sven Rzepka 1, Bernd Michel 1 1 Fraunhofer ENAS, Germany; 2 Technical University Chemnitz, Germany Reliability & Failure Mechanisms in Packages and Assembly Wed-C-13:30-Invited Reliability of Wafer Level Chip Scale Packages René Rongen NXP Semiconductors, Nijmegen, …
Julien GUÉNOLÉ Ph.D. - Tescan workshop in Brno
www.julien-guenole.fr
... lectures will be given by Alessandro Benedetto (Saint-Gobain), Juergen Auersperg (Nanotest) and Jeff de Hosson (University of Groningen) ...
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