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Mathematical model of a galvanometer-based scanner: simulations and...

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Modeling Aspects in Optical Metrology IV, edited by Bernd Bodermann, Karsten Frenner, Richard M. Silver,. Proc. of SPIE Vol , · © SPIE ...

Front Matter: Volume 8789, Proceedings of SPIE | |...

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Karsten Frenner. Richard M. Silver. Editors. 13–14 May Munich, Germany. Sponsored by. SPIE. Cooperating Organisations. European Optical Society.

DIGITAL OPTICAL TECHNOLOGIES - PDF Free Download

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23 CONFERENCE LOCATION: 12A Tuesday - Thursday June Proceedings of SPIE Vol Modeling Aspects in Optical Metrology Conference Chair: Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany) Conference Co-Chairs: Karsten Frenner, Institut für Technische Optik (Germany); Richard M. Silver, ...

Modeling aspects in optical metrology IV : May 2013, Munich,...

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Bernd Bodermann, Karsten Frenner, Richard M. Silver, editors ; sponsored by ...

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Editors, Bernd Bodermann, Karsten Frenner, Richard Silver. Publication status, Published Event, Modeling Aspects in Optical Metrology V - Munich, ...

Nondestructive measurement of two-dimensional refractive index ...experts.umn.edu › publications › nondestructive-...

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Editors, Richard M. Silver, Bernd Bodermann, Karsten Frenner. Publisher, SPIE. ISBN (Electronic), DOIs. https://doi.org

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