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Modeling Aspects in Optical Metrology IV: May 2013, Munich,...

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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Frenner, Karsten [WorldCat Identities]

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Publication Timeline . Most widely held works by Karsten Frenner. Modeling aspects in optical metrology IV : May 2013, Munich, Germany( Book ) 3 editions published in in English and held by 4 WorldCat member libraries worldwide. Proceedings of SPIE offer access to the latest innovations in research and ...

Mathematical model of a galvanometer-based scanner: simulations and...

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Modeling Aspects in Optical Metrology IV, edited by Bernd Bodermann, Karsten Frenner, Richard M. Silver,. Proc. of SPIE Vol , · © SPIE ...

Front Matter: Volume 8789, Proceedings of SPIE | |...

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Karsten Frenner. Richard M. Silver. Editors. 13–14 May Munich, Germany. Sponsored by. SPIE. Cooperating Organisations. European Optical Society.

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Bernd Bodermann, Karsten Frenner, Richard M. Silver Modeling ...

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Modeling Aspects in Optical Metrology VI Bernd Bodermann, Karsten Frenner, Richard M. Silver Eurospan : Proceedings of SPIE offer access ...

A cascaded plasmonic superlens for near field imaging with...

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Phase-sensitive structured illumination to detect nanosized...

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DIGITAL OPTICAL TECHNOLOGIES - PDF Free Download

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23 CONFERENCE LOCATION: 12A Tuesday - Thursday June Proceedings of SPIE Vol Modeling Aspects in Optical Metrology Conference Chair: Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany) Conference Co-Chairs: Karsten Frenner, Institut für Technische Optik (Germany); Richard M. Silver, ...

Improvements on the simulation of microscopic images for the ...www.spiedigitallibrary.org ›

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Stephan Rafler, Thomas Schuster, Karsten Frenner, Wolfgang Osten, and Uwe Seifert "Improvements on the simulation of microscopic images for the defect ...

Modeling Aspects in Optical Metrology VII

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Karsten Frenner. Editors. 24–26 June Munich, Germany. Sponsored by. SPIE. Cooperating Organsations. European Optical Society.

Nondestructive measurement of two-dimensional refractive index ...experts.umn.edu › publications › nondestructive-...

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Editors, Richard M. Silver, Bernd Bodermann, Karsten Frenner. Publisher, SPIE. ISBN (Electronic), DOIs. https://doi.org

Phase-sensitive structured illumination to detect nanosized...

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Phase-sensitive structured illumination to detect nanosized asymmetries in silicon trenches. Ahmad Faridian, Valeriano Ferreras Paz, Karsten Frenner, Giancarlo Pedrini, Arie Den Boef, Wolfgang Osten. Journal of Micro/Nanolithography MEMS and MOEMS, April 2015, SPIE; DOI: jmm The author ...

Superaccurate camera calibration via inverse rendering —...

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Editors, Bernd Bodermann, Karsten Frenner. Number of pages, 9. Place of Publication, USA. Publisher, SPIE - International Society for Optical ...

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Stephan Rafler
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Bernd Bodermann

Wolfgang Osten

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