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R&D: Fault-Aware Dependability Enhancement Techniques ...
www.storagenewsletter.com
— ... Taiwan, Kohei Miyase, Dept. Creative Informatics, Kyushu Institute of Technology, Fukuoka, Japan, Chun-Lung Hsu, and Chi-Tien Sun, ... › ...
Netzwerk-Profile
LinkedIn: Kohei Miyase - visiting research scholar - Albert-Ludwigs LinkedInjp.linkedin.com › kohei-miyase-2802aa31
Kohei Miyase. visiting research scholar at Albert-Ludwigs-Universität Freiburg im Breisgau. Albert-Ludwigs-Universität Freiburg im Breisgau九州工業大学 ...
Kohei Miyase - visiting research scholar - The University of Freiburg ...
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Miyase, Kohei: د Z-Library مفت الکترونیکی کتابتون
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Xiaoqing Wen,, Kohei Miyase,, Seiji Kajihara,, Tatsuya Suzuki,, Yuta Yamato,, Girard, Patrick, Yuji Ohsumi,, Laung-Terng Wang,. › author
Miyase, Kohei: मुफ़्त में डाउनलोड. ई-बुक पुस्तकालय. Z-Library में ऑन ...
hi.booksc.org
Xiaoqing Wen,, Kohei Miyase,, Seiji Kajihara,, Tatsuya Suzuki,, Yuta Yamato,, Girard, Patrick, Yuji Ohsumi,, Laung-Terng Wang,. साल: भाषा:. › author
Business-Profile
University of Freiburg: Employee Directory | ZoomInfo.com
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Results of 13 — Contact Name profile photo for Kohei Miyase Kohei Miyase; Contact Info Email Direct; Job Title Visiting Research Scholar; Location. › pic
Ausbildung
Details of a Researcher - AIKYO, Takashi
w-rdb.waseda.jp
Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara. › html
A Per-Test Fault Diagnosis Method Based on the X-Fault Modelsearch.ieice.org › bin › summary
search.ieice.org
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Yuta YAMATO Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA Publication IEICE TRANSACTIONS on ...
Bücher
E. Salomon | 1 Publications | 103 Citations | Related Authors
typeset.io
Xiaoqing Wen 1, K. Enokimoto 1, Kohei Miyase 1, Yuta Yamato 1 +4 more•Institutions (2). 30 Apr TL;DR: This scheme is the first of its kind for ... › authors
Thermal Issues in Testing of Advanced Systems on Chip
books.google.com
... [Zschech02] Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A Kochte, Seiji Kajihara, Patrick Girard, and Mohammad Tehranipoor.
Dokumente zum Namen
Miyase, Kohei [WorldCat Identities]
worldcat.org
Most widely held works by Kohei Miyase. ASP-DAC th Asia and South Pacific Design Automation Conference : proceedings : date: January , ... › identities
ICCD Proceedings 2006
vcl.ece.ucdavis.edu
von B Dally — Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang and. Kewal Saluja. ~~~ Session 6 ~~~. › pubs › TableOfContents
SAT-based capture-power reduction for ACM Digital Library
dl.acm.org
von MA Kochte · · Zitiert von: 4 — SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures · Authors: · Michael A. Kochte · Kohei Miyase. Kyushu Institute ... von K Miyase · · Zitiert von: 17 — A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. Authors: Kohei Miyase. › doi › abs › doi
Wissenschaftliche Veröffentlichungen
DFG - GEPRIS - Test und Diagnose in Nanoscale-Technologiengepris.dfg.de › gepris › projekt
gepris.dfg.de
Matthias Sauer, Jie Jiang, Sven Reimer, Kohei Miyase, Xiaoqing Wen, Bernd Becker, and Ilia Polian (See online at https://doi.org ATS ) ...
Efficient Test Set Modification for Capture Power Reduction: Ingenta...
www.ingentaconnect.com
Xiaoqing Wen,1∗ Tatsuya Suzuki,1 Seiji Kajihara,1 Kohei Miyase,2 Yoshihiro Minamoto,2. Laung-Terng Wang,3 and Kewal K. Saluja4.
kohei miyase shinobu: Topics by Science.gov
www.science.gov
Sample records for kohei miyase shinobu. « 1; ». Streptomyces phaeopurpureus Shinobu (Approved Lists 1980) and Streptomyces griseorubiginosus ...
Veröffentlichungen allgemein
LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation CORE
core.ac.uk
von Y Yamato · · Zitiert von: 5 — Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, and Laung-Terng Wang. C. Page 2. > REPLACE THIS LINE WITH YOUR PAPER ... › download › pdf
Fault-Aware Dependability Enhancement Techniques for Phase Change...
link.springer.com
· Hui-Ping Li,; Kohei Miyase,; […] Chun-Lung Hsu &; Chi-Tien Sun ...
2009 International Conference on Computer-Aided Design ...
researchr.org
[doi] · A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environmentKohei Miyase, ... › iccad-2009
Formal Test Point Insertion for Region-based Low-Capture-Power...
www.dfki.de
Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen. In: The 25th Asian Test Symposium. Asian Test Symposium (ATS-25) November ...
Sonstiges
WO A1 - dispositif de conversion, procédé de conversion,...
patents.google.com
... PDF Find Prior Art Similar. Other languages: English: Japanese; Inventor: Seiji Kajihara: Kohei Miyase: Xiaoqing Wen: Yoshihiro Minamoto: Hiroshi Date ...
TWI B - - Google Patents
patents.google.com
Download PDF Find Prior Art Similar. Other languages: Chinese; Inventor: Seiji Kajihara: Kohei Miyase: Xiaoqing Wen: Yoshihiro Minamoto: Hiroshi Date ... › patent
Kohei Miyase - Patent applications
www.patentsencyclopedia.com
Kohei Miyase. Kohei Miyase, Fukuoka JP. Patent application number, Description, Published , CONVERSION DEVICE, CONVERSION METHOD, ...
Kohei Miyase
easychair.org
ITC 2017: INTERNATIONAL TEST CONFERENCE Welcome MessagePROGRAMINDEXES. Kohei Miyase. Organization: Kyushu Institute of Technology ...
Kohei Miyase, Fukuoka JP - Patent applicationswww.patentsencyclopedia.com › inventor › kohei-m...
www.patentsencyclopedia.com
Patent application number, Description, Published , CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM - Provided are a ...
Fault-Aware Dependability Enhancement Techniques for Phase …
www.springerprofessional.de
Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun » Get access to the full-text. Important notes. Responsible Editor: N. A. Touba. Publisher's Note. Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
A GA-Based X-Filling for reducing launch switching activity toward...
kyushu-u.pure.elsevier.com
... launch switching activity toward specific objectives in at-speed scan testing. Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara.
A GA-based method for high-quality X-filling to reduce launch...
kyushu-u.pure.elsevier.com
... high-quality X-filling to reduce launch switching activity in at-speed scan testing. Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara.
A Novel Scheme to Reduce Power Supply Noise for High-Quality At-Speed...
hal-lirmm.ccsd.cnrs.fr
... At-Speed Scan Testing. Xiaoqing Wen 1 Kohei Miyase 1 Seiji Kajihara 1 Tatsuya Suzuki 1 Yuta Yamato 1 Patrick Girard 2 Yuji Ohsumi 3 Laung-Terng Wang 4
th Asia and South Pacific Design Automation Aconf
www.aconf.org
Kohei Miyase (Kyushu Institute of Technology). Shinobu Nagayama (Hiroshima City University). Publicity Co-Chairs. Nozomu Togawa (Waseda University). › ...
A soft-error tolerant TCAM using partial don't-care keys — Meiji...
meiji.elsevierpure.com
... Stefan Holst, Kohei Miyase. Department of Computer Science. Research output: Chapter in Book/Report/Conference proceeding › Conference contribution.
ATS-08
www.ieee-ats.org
... Yield Loss Risk in At-Speed Scan Testing Hiroshi FURUKAWA, Xiaoqing WEN, Kohei MIYASE, Yuta YAMATO, Seiji KAJIHARA (Kyushu Inst. of Tech. - Japan) ...
ICCD PROCEEDINGS 2002, IEEE INTERNATIONAL ...iccd.et.tudelft.nl › Proceedings › proceedings2002
iccd.et.tudelft.nl
Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy; An Extended Class of Sequential Circuits with Combinational Test Generation Complexity
Awards Recipients at WRTLT - TEST PLAZA
testplaza.fujiwaralab.net
Xiaoqing Wen, Yuta Yamato, Kohei Miyase, Seiji Kajihara, and Kozo Kinoshita WRTLT "RTL Don't Care Path Identification and Synthesis for Transforming ... › wrtlt
CTX: A Clock-Gating-Based Test Relaxation and X-Filling ...
hal-lirmm.ccsd.cnrs.fr
Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, et al.. CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for ... › lirm...
Committees – The 21st Workshop on RTL and High Level Testing
www.ieee-wrtlt.org
... National Sun Yat-sen University; Huawei Li, Chinese Academy of Sciences; Kohei Miyase, Kyushu Institute of Technology; Chia Yee Ooi, Universiti Teknologi ...
Low Capture Switching Activity Test Generation - ProQuestwww.proquest.com › scholarly-journals › docview
www.proquest.com
Xiaoqing Wen & Kohei Miyase & Tatsuya Suzuki &. Seiji Kajihara & Laung-Terng Wang & Kewal K. Saluja &. Kozo Kinoshita. Received: 1 February Accepted: ...
D3T09 - Call for Participation - IEEE TTTC
www.ieee-tttc.org
Chair – Kohei Miyase (KIT). On-Chip Power Supply Noise Measurements Ekarat Laohavaleeson and Chintan Patel (UMBC). Verification of Convolution Relation ... › ebshistory
Effective IR-drop reduction in at-speed scan Kyushu University
kyushu-u.pure.elsevier.com
Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara. › ...
Verwandte Suchanfragen zu Kohei Miyase
| Stefan Holst Stephan Eggersglüß Daniel Tille | Ilia Polian Bernd Becker |
Personen Vorname "Kohei" (56) Name "Miyase" (1) |
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