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Bruker Receives Contract from National Institute of Standards and...

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Dr. Frank Saurenbach, Bruker Nano Vice President for AFM, commented: "Bruker Nano has many years of experience in traceable AFM for ...

Bruker Receives Contract from NIST for N8 TITANOS Large Sample Atomic...

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The instrument will be used by NIST's Precision Engineering Division at its Manufacturing Engineering Laboratory.

Bruker Nano Attains Atomic Resolution with N8 TITANOS Large Sample...

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Bruker Nano today announced that its N8 TITANOS™ large-sample inspection AFM has been further improved to provide highest spatial resolving power. Due to its...

Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy...

www.finanznachrichten.de

Bruker AXS GmbH today announced that it has signed an agreement to acquire all of the equity of S.I.S. Surface Imaging Systems GmbH, a company with annual...

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SameName_Update1/SF.csv at master · DionyBudy/SameName_Update1 ·...

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Contribute to DionyBudy/SameName_Update1 development by creating an account on GitHub.

Browse People - The Nanoscale World

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Atomic Force Microscopy and Metrology Worldwide Community

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Frank Saurenbach - Patents

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Recent bibliographic sampling of Frank Saurenbach patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title): ...

Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its...

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Dr. Frank Burgaezy, Bruker AXS Executive Vice President, commented: "The new Bruker ... with standard optical microscopes," said S.I.S. Managing Director Dr. Frank Saurenbach Share article on social media or email:.

Bruker Receives Contract from National Institute of Standards &...

jp.advfn.com

Dr. Frank Saurenbach, Bruker Nano Vice President for AFM, commented: “Bruker Nano has many years of experience in traceable AFM for ...

Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy...

www.prweb.com

S.I.S. Surface Imaging Systems GmbH was founded in by Dr. Frank Saurenbach and Dr. Hans-Achim Fuss, two physicists with extensive experience in AFM/SPM technology. After the acquisition, S.I.S. will remain in Herzogenrath and will be renamed to "Bruker Nano GmbH". Drs. Saurenbach and ...

Bücher

Frank Saurenbach | XanEdu Customization Platform

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Use materials by this author in your textbook! AcademicPub holds over eight million pieces of educational content – such as case studies and journal articles ...

Thema: Tastpitzen mit integriertem MOSFET-Sensor für die Frank...

books.google.de

... Rastersondenmikroskopie unter Verwendung derartiger Sensoren: Abschlußbericht. Author, Frank Saurenbach. Publisher, Surface Imaging Systems ,

Spinwellen und Ummagnetisierung in antiferromagnetisch gekoppelten...

books.google.de

... Ummagnetisierung in antiferromagnetisch gekoppelten Schichtsystemen. Front Cover. Frank Saurenbach. Zentralbibliothek der Kernforschungsanlage,

Dokumente zum Namen

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Saurenbach, Frank [WorldCat Identities]

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Publication Timeline |. View works by Frank Saurenbach · View works by Frank Saurenbach · View works by Frank Saurenbach ...

Apr1998: Atomic Force Microscopy in Effusion Cytology

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Authors: Bernd Ro?, M.D., Helma Motherby, M.D., Frank Saurenbach, Ph.D., Josef Frohn, Ph.D., Mary Kube and Alfred Bˆcking, M.D., F.I.A.C.. Objective: To ...

Desarrollo de un sistema biosensor opto-mecánico Acceda ULPGC

acceda.ulpgc.es

[47] Jana Wehrmeister, Achim Fuß, Frank Saurenbach, Rüdiger Berger, and. Mark Helm. Readout of micromechanical cantilever sensor arrays by fabry-.

Investigation of spin structure in fcc Fe-Ni-Mn - [PDF Document]

vdocuments.site

... SPIN STRUCTURE IN fcc Fe-Ni-Mn BERNHARD HUCK, FRANK SAURENBACH and JORGEN HESSE Institut fiir Metallphysik und Nukleare ...

Wissenschaftliche Veröffentlichungen

Microelectronic Engineering | Micro- and Nano-Engineering MNE

www.sciencedirect.com

... molecular monolayers containing tungsten polyoxometalates. Nikos Glezos, Antonios M. Douvas, Panagiotis Argitis, Frank Saurenbach, ... Christos Livitsanos .

Veröffentlichungen allgemein

Investigation of spin structure in fcc Fe-Ni-Mn | SpringerLink

link.springer.com

BERNHARD HUCK, FRANK SAURENBACH and JORGEN HESSE. Institut fiir Metallphysik und Nukleare Festk#rperphysik der. Technischen Universitiit ...

Sonstiges

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WO A2 - Vorrichtung zur optischen nahfeldmikroskopie...

patents.google.com

Izumitelji, Hans-Achim Fuss, Frank Saurenbach, Hans-Ulrich Danzebrink. Prijavitelj, Surface Imaging Systems (S.I.S.) Rastersonden- Und Sensortechnik Gmbh.

DE C2 - Rastersondenmikroskop mit Detektorsonde

patents.google.com

Inventors, Frank Saurenbach, Hans-Achim Fuss. Applicant, Forschungszentrum Juelich Gmbh. Export Citation, BiBTeX, EndNote, RefMan. Non-Patent Citations ...

Suche nach "Saurenbach, Frank"

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Handelsregisterbekanntmachungen und Netzwerk zu Frank Saurenbach: Bruker Nano GmbH.

Frank Saurenbach N\A: Kontakte, Telefon, Adresse, Arbeit Frank...

deubiz.com

Unternehmensdaten Frank Saurenbach N\A sind Details, Adresse, Telefonnummer, Kontakte, Kommentare, offene Stellen. Ein ausführlicher Bericht über die Arbeit...

Videos | Saxophonquartett First Ladies Berlin

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Vielen Dank an Anke Altmann und Frank Saurenbach www.vision und film.de, sowie für das Filmen in der tollen Location www.berliner-teufelsberg.com

Bruker ‘forces’ its way into the AFM market

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S.I.S was founded in by the company's managing directors Dr Frank Saurenbach and Dr Hans-Achim Fuss who have driven annual ...

Bruker AXS Buying AFM Maker | News & Features | Aug |...

www.photonics.com

Analytical x-ray systems manufacturer Bruker AXS GmbH of Karlsruhe, Germany, announced it will acquire the German company SIS (Surface Imaging Systems

Bruker AXS Announces Closing Of S.I.S. Acquisition And Exhibits Its...

www.metrologyworld.com

Bruker AXS GmbH announces the closing of its acquisition of S.I.S. Surface Imaging Systems GmbH, located near Aachen, Germany

April Table of Contents

www.aqch.com

Bernd Ro?, M.D., Helma Motherby, M.D., Frank Saurenbach, Ph.D., Josef Frohn, Ph.D., Mary Kube and Alfred Bˆcking, M.D., F.I.A.C.. ABSTRACT Advances ...

Bruker Nabs NIST Contract for AFM | Business | Apr |...

www.photonics.com

Email Facebook Twitter Google+ LinkedIn Comments ... of experience in traceable AFM for metrology purposes,” said Dr. Frank Saurenbach, ...

Bruker closes and renames S.I.S. - News

siliconsemiconductor.net

Our selection of industry specific magazines cover a large range of topics.

Bruker enters microscopy market. - Free Online Library

www.thefreelibrary.com

Drs. Frank Saurenbach and Hans-Achim Fuss, who founded the business in 1993, will remain with the company as managing directors. "Many of the AFM/SPM market segments and applications overlap with those of our X-ray diffraction (XRD) business, making the S.I.S. products an excellent addition for our established ...

Electrical characterization of molecular monolayers containing...

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Electrical characterization of molecular monolayers containing tungsten polyoxometalates. Nikos Glezos, Antonios M. Douvas, Panagiotis Argitis, Frank Saurenbach, Juergen Chrost, Christos Livitsanos. Microelectronic Engineering, April 2006, Elsevier; DOI: j.mee The author haven't finished ...

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