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TuZ Programm
conference.vde.com
Gurunath Kadam 1,2, Markus Rudack 1, Jürgen Alt 1, 1 Intel Deutschland, 2 Technical University of Darmstadt Improving SRAM Test Quality by Leveraging Self-timed Circuits Josef Kinseher 1, Leonardo B. Zordan 2, Ilia Polian 3, Andreas Leininger 3, 1 Intel Mobile Communications Neubiberg, 2 Intel Mobile Communications Sophia-Antipolis,
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