Martin Versen und Failure - Info zur Person

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EDFA Magazine - Electronic Device Failure Analysis Society

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Martin Versen, University of Applied Sciences Rosenheim, Germany Larry Wagner, LWSN Consulting, Plano, TX, USA Liz Marquard, Managing Editor, ASM ...

OPUS 4 | Suchen

opus4.kobv.de

Keywords. Microelectronics (6); Custom specific electronics (1); Cyberphysische Produktionssysteme (1); DRAM Devices (1); DRAM Failure Analysis (1); DRAM ...

Microelectronics Failure Analysis: Desk Referencegoogle.com

books.google.com

... Failure Analysis and Defect Localization Techniques Martin Versen Failure Analysis of Passive Components ...

Microelectronics Fialure Analysis Desk Reference, Seventh ...google.com

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Failure. Analysis. and. Defect. Localization. Techniques*. Martin Versen, University of Applied Sciences Rosenheim, Germany ...

ISTFA 2013: Proceedings from the 39th International Symposium for...

books.google.ch

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide...

ISTFA 2014: Conference Proceedings from the 40th International...

books.google.ch

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the...

Microelectronics failure analysis : desk reference Seventh ...国立国会図書館オンライン

ndlonline.ndl.go.jp

DRAM failure analysis and defect localization techniques / Martin Versen ; The power of semiconductor memory failure signature analysis / Cary A. Gloor ...