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EDS of semiconductor lamellae in SEM and STEM | Bruker
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Dr. Meiken Falke. Global Product Manager EDS/TEM, Bruker Nano Analytics. Max Patzschke. Application Scientist EDS, Bruker Nano Analytics. Dr. Purvesh Soni. …Web
In-situ EDS Element Mapping at Elevated Temperatures | Brukerwww.bruker.com › int › news-and-events › webinars
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Dr. Meiken Falke. Global Product Manager TEM-EDS, Bruker Nano Analytics. Dr. Igor Nemeth. Application Scientist EDS, Bruker Nano Analytics. Mauro Porcu.
New! Windowless high collection angle EDS detector with
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Dr. Meiken Falke. Global Product Manager TEM-EDS, Bruker Nano Analytics. Andi Kaeppel. Senior Product Manager EDS/SEM, Bruker Nano Analytics ... › ...
XFlash 7 EDS Detector Series for Electron MicroscopyBruker
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Meiken Falke. Global Product Manager EDS/TEM, Bruker Nano Analytics. Related Products. The Next Generation of EDS Detectors. XFlash 760 EDS spectrometer ...
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