Dr. Yee See Khee - UTHM Community
community.uthm.edu.my
Alireza Kazemipour, Michael Wollensack, Johannes Hoffmann, Martin Hudli?ka, See-Khee Yee, Jurg Rufenacht, Daniel Stalder, Gregory Gaumann & Markus Zeier › ...
2019 International Conference on Electromagnetics in ...
toc.proceedings.com
Alireza Kazemipour ; Johannes Hoffmann ; Daniel Stalder ; Michael Wollensack ; Juerg Rufenacht ; Markus Zeier. PERFORMANCE OF MLACA WITH MODIFIED GROUPING ... › ...
89TH ARFTG MICROWAVE MEASUREMENT CONFERENCE ...
www.ims2017.org
Michael Wollensack, Johannes Hoffmann, Daniel. Stalder, Juerg Ruefenacht, Markus Zeier,. Federal Institute of Metrology METAS ,. › images › files › APP
AES Marrakesh - Morocco
vb.ftmc.lt
von T Gric · — Alireza Kazemipour, Johannes Hoffmann, Michael Wollensack, Daniel Stalder, Juerg Ruefenacht, Markus Zeier,. EMi/EMC/PiM chambers, instrumentation, ... › object › elaba:
Best Practice Guide for Planar S-Parameter Measurements ...
ridler-pubs.webs.com
Johannes Hoffmann, Michael Wollensack, Markus Zeier, METAS. Gia Ngoc Phung, Wolfgang Heinrich, FVB. Konstantin Lomakin, Gerald Gold, Klaus Helmreich, FAU. › NMR_227
Alireza Kazemipour - dblp
dblp.org
— Alireza Kazemipour , Johannes Hoffmann , Michael Wollensack , Martin Hudlicka , Jürg Rüfenacht , Daniel Stalder , Djamel Allal , Gregory ... › Persons
Analytical Uncertainty Evaluation of Material Parameter ...
link.springer.com
von A Kazemipour · · Zitiert von: 6 — Alireza Kazemipour, Michael Wollensack, Johannes Hoffmann, Jürg Rüfenacht, Daniel Stalder, Gregory Gäumann & Markus Zeier. › article
Alle Infos zum Namen "Michael Wollensack"
14Ind02 PlanarCal: Publications
www.ptb.de
Title: VNA Tools II: Calibrations Involving Eigenvalue Problems: Author(s): Michael Wollensack, Johannes Hoffmann, Daniel Stalder, Juerg Ruefenacht and Markus Zeier ...
Conference Contributions before 2013
ief.ee.ethz.ch
Johannes Hoffmann, Michael Wollensack, Markus Zeier, Jens Niegemann, Hans-Peter Huber and Ferry Kienberger. 12th IEEE Conference on Nanotechnology ... › publications
EMINDA Technical Publications
projects.npl.co.uk
; Johannes Hoffmann, Michael Wollensack, Markus Zeier, Jens Niegemann, Hans-Peter Huber, Ferry Kienberger, 'A Calibration Algorithm for Nearfield ... › eminda
IEEE International Microwave Symposium | Technical Sessions
2017.ims-ieee.org
Johannes Hoffmann, Michael Wollensack, Juerg Ruefenacht. Presenter: Johannes Hoffmann, Eidgenössisches Institut für Metrologie METAS. Abstract. › technical-programs2 › com_te...
List of references - OUCI
ouci.dntb.gov.ua
von T Ozturk · · Zitiert von: 22 — Alireza Kazemipour, Michael Wollensack, Johannes Hoffmann, Martin Hudlička, See-Khee Yee, Jürg Rüfenacht, Daniel Stalder, Gregory Gäumann, Markus Zeier. › works
Measurement uncertainty of electrical reflection and transmission...
www.growkudos.com
Markus Zeier, Johannes Hoffmann, Juerg Ruefenacht, Michael Wollensack. tm - Technisches Messen, January 2017, De Gruyter; DOI: teme
Workshops - MTT-S
mtt.org
Johannes Hoffmann – Eidgenössisches Institut für Metrologie METAS; Michael Wollensack – Eidgenössisches Institut für Metrologie METAS; Juerg Ruefenacht ... › workshops
标准载荷方法：太赫兹频率下材料表征的新校准技术 - X-Mol
www.x-mol.com
Alireza Kazemipour , Johannes Hoffmann , Michael Wollensack , Martin Hudlicka , Jurg Rufenacht , Daniel Stalder , Djamel Allal , Gregory Gaumann , Markus ... › paper
Publications & Presentations - HF Circuits
projects.npl.co.uk
... Johannes Hoffmann, Juerg Ruefenacht, Michael Wollensack ,Comparison of methods for measurement of Equivalent Source Match comparison of existing ...
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