Michael Wollensack und Markus Zeier - Info zur Person

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Dr. Yee See Khee - UTHM Community

community.uthm.edu.my

Alireza Kazemipour, Michael Wollensack, Johannes Hoffmann, Martin Hudli?ka, See-Khee Yee, Jurg Rufenacht, Daniel Stalder, Gregory Gaumann & Markus Zeier › ...

Contemporary evaluation of measurement uncertainties in vector...

www.degruyter.com

Markus , Johannes Hoffmann , Juerg Ruefenacht und Michael Wollensack. 1 Federal Institute of Metrology METAS...

2019 International Conference on Electromagnetics in ...

toc.proceedings.com

Alireza Kazemipour ; Johannes Hoffmann ; Daniel Stalder ; Michael Wollensack ; Juerg Rufenacht ; Markus Zeier. PERFORMANCE OF MLACA WITH MODIFIED GROUPING ... › ...

89TH ARFTG MICROWAVE MEASUREMENT CONFERENCE ...

www.ims2017.org

Michael Wollensack, Johannes Hoffmann, Daniel. Stalder, Juerg Ruefenacht, Markus Zeier,. Federal Institute of Metrology METAS ,. › images › files › APP

AES Marrakesh - Morocco

vb.ftmc.lt

von T Gric · — Alireza Kazemipour, Johannes Hoffmann, Michael Wollensack, Daniel Stalder, Juerg Ruefenacht, Markus Zeier,. EMi/EMC/PiM chambers, instrumentation, ... › object › elaba:

Best Practice Guide for Planar S-Parameter Measurements ...

ridler-pubs.webs.com

Johannes Hoffmann, Michael Wollensack, Markus Zeier, METAS. Gia Ngoc Phung, Wolfgang Heinrich, FVB. Konstantin Lomakin, Gerald Gold, Klaus Helmreich, FAU. › NMR_227

Analytical Uncertainty Evaluation of Material Parameter ...

link.springer.com

von A Kazemipour · · Zitiert von: 6 — Alireza Kazemipour, Michael Wollensack, Johannes Hoffmann, Jürg Rüfenacht, Daniel Stalder, Gregory Gäumann & Markus Zeier. › article

14Ind02 PlanarCal: Publications

www.ptb.de

Title: VNA Tools II: Calibrations Involving Eigenvalue Problems: Author(s): Michael Wollensack, Johannes Hoffmann, Daniel Stalder, Juerg Ruefenacht and Markus Zeier ...

Conference Contributions before 2013

ief.ee.ethz.ch

Johannes Hoffmann, Michael Wollensack, Markus Zeier, Jens Niegemann, Hans-Peter Huber and Ferry Kienberger. 12th IEEE Conference on Nanotechnology ... › publications

EMINDA Technical Publications

projects.npl.co.uk

; Johannes Hoffmann, Michael Wollensack, Markus Zeier, Jens Niegemann, Hans-Peter Huber, Ferry Kienberger, 'A Calibration Algorithm for Nearfield ... › eminda

List of references - OUCI

ouci.dntb.gov.ua

von T Ozturk · · Zitiert von: 22 — Alireza Kazemipour, Michael Wollensack, Johannes Hoffmann, Martin Hudlička, See-Khee Yee, Jürg Rüfenacht, Daniel Stalder, Gregory Gäumann, Markus Zeier. › works

Measurement uncertainty of electrical reflection and transmission...

www.growkudos.com

Markus Zeier, Johannes Hoffmann, Juerg Ruefenacht, Michael Wollensack. tm - Technisches Messen, January 2017, De Gruyter; DOI: teme

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