Miriam Rauer und Michael Kaloudis - Info zur Person

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Industrielle Computertomographie WENZEL Metromec AGwenzel-metromec.ch › 9-deutsch › news › 458-industrielle-computert...

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Miriam Rauer, Prof. Dr. Michael Kaloudis Hochschule Aschaffenburg Labor für Werkstofftechnik T Lithium-Ionen-Akkumulator Die positive ...

@article{RauerVolkertHaerteretal.2014, author = {Miriam Rauer and ...

opus4.kobv.de

@article{RauerVolkertHaerteretal.2014, author = {Miriam Rauer and Antje Volkert and Stefan H{\"a}rter and Timo Schreck and Michael Kaloudis}, title ...

Characterization of Computer Tomography Scanners Using the...

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Amrhein, Sebastian, Miriam Rauer, and Michael Kaloudis. "Characterization of Computer Tomography Scanners Using the Probability of ...

Nondestructive Characterization of Voids in Rear Local Contacts of...

kops.uni-konstanz.de

Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells; ... Miriam RAUER, Michael KALOUDIS, Stefan DAUWE, Axel HERGUTH, ...

KOPS.Nondestructive Characterization of Voids in Rear Local Contacts...

kops.uni-konstanz.de

DRESSLER, Katharina, Miriam RAUER, Michael KALOUDIS, Stefan DAUWE, Axel HERGUTH, Giso HAHN, Nondestructive Characterization of Voids in ...

Computed-Tomography-Based Analysis of Voids in SnBi57Ag1 Solder...

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Computed-Tomography-Based Analysis of Voids in SnBi57Ag1 Solder Joints and Their Influence on the Reliability. Authors; Authors and affiliations. Miriam RauerEmail author; Antje Volkert; Timo Schreck; Stefan Härter; Michael Kaloudis. Miriam Rauer. 1. Email author; Antje Volkert. 1. Timo Schreck. 1. Stefan Härter. 2.

2015 European Microelectronics Packaging Conference (EMPC 2015) - PDF

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... of low Ag Solder Joints in High Power LEDs 44 Miriam Rauer, Timo Schreck, Stefan Härter 2, Michael Kaloudis University of Applied Sciences Aschaffenburg, ...

th Electronic System-Integration Technology Conference (ESTC...

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... THE INFLUENCE OF VOIDS ON THE RELIABILITY OF SOLDER-JOINTS FOR LED-APPLICATIONS Ping Xu ; Miriam Rauer ; Michael Kaloudis ; Joerg Franke.

OPUS 4 | Ausfallanalyse an einem Lithium-Ionen Akkumulator

opus4.kobv.de

Metadaten; Author: Miriam Rauer, Michael Kaloudis: Parent Title (German): Maschinenmarkt: Document Type: Article: Language: German: Year of Completion: 2014

Characterization of Computer Tomography Scanners Using the...

www.springerprofessional.de

Characterization of Computer Tomography Scanners Using the Probability of Detection Method. Zeitschrift: Journal of Nondestructive Evaluation > Ausgabe Autoren: Sebastian Amrhein, Miriam Rauer, Michael Kaloudis. » Jetzt Zugang zum Volltext erhalten ...