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Online-Katalog der UB Ilmenau - results/titledata
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Weighted spline based integration for reconstruction of freeform wavefront / Kamal K. Pant, Dali R. Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. …
Development of an In-situ Metrology Technique for Freeform Optics
opg.optica.org
... Technique for Freeform Optics. Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher.
Weighted spline based integration for reconstruction of freeform...
opg.optica.org
Kamal K. Pant, Dali R. Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher. Author Information ...
Design considerations for the absolute testing approach of ...OUCI
ouci.dntb.gov.ua
Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. https://doi.org ao · , Applied Optics, № 5, p ... Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. https://doi.org ao · , Applied Optics, № 5, p ...
Development of a metrology technique suitable for in situ ...EBSCO Information Services
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von DR Burada · · Zitiert von: 14 — Mohamed Bichra and Stefan Sinzinger: Fachgebiet Technische. Optik ... Mohamed Bichra studied micro and medical technology with a par- ticular ... von DR Burada · · Zitiert von: 14 — Mohamed Bichra and Stefan Sinzinger: Fachgebiet Technische. Optik ... Mohamed Bichra studied micro and medical technology with a par- ticular ...
Development of metrology for freeform optics in reflection ...Grow Kudos
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Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI: Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI:
Development of metrology for freeform optics in reflection ...SPIEDigitalLibrary.org
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von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra, von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra,1 ...
Experimental investigations on characterization of freeform ...SPIEDigitalLibrary.org
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von DR Burada · · Zitiert von: 35 — ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher "Experimental investigations on characterization of freeform ... von DR Burada · · Zitiert von: 35 — ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher "Experimental investigations on characterization of freeform ...
Publications - Web IITD Sites - IIT DelhiIIT Delhi
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Mohamed Bichra, N.Sabitov, Kamal K. Pant, Dali R. Burada, Gufran S. Khan, Stefan Sinzinger, Subaperture wavefront measurement using Talbot interferometry ... Mohamed Bichra, N.Sabitov, Kamal K. Pant, Dali R. Burada, Gufran S. Khan, Stefan Sinzinger, Subaperture wavefront measurement using Talbot interferometry ...
Subaperture stitching for measurement of freeform wavefrontNational Institutes of Health (NIH) (.gov)
pubmed.ncbi.nlm.nih.gov
von KK Pant · · Zitiert von: 55 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Mahendra P Singh, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra ... von KK Pant · · Zitiert von: 55 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Mahendra P Singh, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra ...
Weighted spline based integration for reconstruction of ...National Institutes of Health (NIH) (.gov)
pubmed.ncbi.nlm.nih.gov
von KK Pant · · Zitiert von: 15 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra Shakher. PMID ... von KK Pant · · Zitiert von: 15 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra Shakher. PMID ...
DIGITAL OPTICAL TECHNOLOGIES - PDF Free Download
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17:30: Development of metrology for freeform optics in reflection mode, Dali R. Burada, Kamal K. Pant, Vinod Mishra, Indian Institute of Technology Delhi (India); Mohamed Bichra, Technische Univ. Ilmenau (Germany); Gufran S. Khan, Indian Institute of Technology Delhi (India); Stefan Sinzinger, Technische Univ. Ilmenau ...
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