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Development of an Innovative Metrology Technique for Freeform ...Google Books
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Mohamed Bichra. Contributors, Stefan Sinzinger, Eberhard Manske, Martin Hoffmann. Publisher, Technische Universität Ilmenau. Export Citation, BiBTeX EndNote ... Mohamed Bichra. Contributors, Stefan Sinzinger, Eberhard Manske, Martin Hoffmann. Publisher, Technische Universität Ilmenau. Export Citation, BiBTeX EndNote ...
ADVANCED OPTICAL TECHNOLOGIESDe Gruyter
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Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ...
Development of a metrology technique suitable for in situ ...De Gruyter
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... Mohamed Bichra. Mohamed Bichra studied micro and medical technology with a particular focus on laser systems at the University of Applied Sciences Mohamed Bichra. Mohamed Bichra studied micro and medical technology with a particular focus on laser systems at the University of Applied Sciences ...
DNB, Katalog der Deutschen Nationalbibliothek
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webDevelopment of an innovative metrology technique for freeform optics based on a modified Talbot-wavefront-sensor / Mohamed Bichra ; Gutachter: Eberhard Manske, Martin …
Patents Publications Book Chapters Conference Papersdokumen.tips
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Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ...
Development of an In-situ Metrology Technique for Freeform Optics
opg.optica.org
... Technique for Freeform Optics. Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher.
advanced optical technologiesProQuest
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von M Pfeffer — Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ... von M Pfeffer — Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ...
Experimental investigations on characterization of freeform wavefront...
spie.org
· Mohamed Bichra, Technische Univ. Ilmenau (Germany). Gufran Sayeed Khan, Instrument Design Development Ctr. (India) Stefan Sinzinger ...
Development of a metrology technique suitable for in situ ...EBSCO Information Services
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von DR Burada · · Zitiert von: 14 — Mohamed Bichra and Stefan Sinzinger: Fachgebiet Technische. Optik ... Mohamed Bichra studied micro and medical technology with a par- ticular ... von DR Burada · · Zitiert von: 14 — Mohamed Bichra and Stefan Sinzinger: Fachgebiet Technische. Optik ... Mohamed Bichra studied micro and medical technology with a par- ticular ...
Development of metrology for freeform optics in reflection ...Grow Kudos
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Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI: Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI:
Development of metrology for freeform optics in reflection ...SPIEDigitalLibrary.org
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von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra, von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra,1 ...
DIGITAL OPTICAL TECHNOLOGIES - PDF Free Download
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17:30: Development of metrology for freeform optics in reflection mode, Dali R. Burada, Kamal K. Pant, Vinod Mishra, Indian Institute of Technology Delhi (India); Mohamed Bichra, Technische Univ. Ilmenau (Germany); Gufran S. Khan, Indian Institute of Technology Delhi (India); Stefan Sinzinger, Technische Univ. Ilmenau ...
Freeform optics - BibliographiesGrafiati
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— Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher. "Development of a metrology technique — Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher. "Development of a metrology technique ...
Zeitschriftenartikel: „Manufacturing metrology“Grafiati
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— Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger und Chandra Shakher. „Development of a metrology technique suitable — Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger und Chandra Shakher. „Development of a metrology technique suitable ...
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