Optical Measurement Systems for Industrial Inspection XStanford SearchWorks
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Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ...
ADVANCED OPTICAL TECHNOLOGIESDe Gruyter
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Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ...
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Weighted spline based integration for reconstruction of freeform wavefront / Kamal K. Pant, Dali R. Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. …
Investigations on sub-aperture stitching approach for ...Optica Publishing Group
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von M Bichra · · Zitiert von: 1 — Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher JTu3A.11 Frontiers in Optics (FiO) Previous Article Next ... von M Bichra · · Zitiert von: 1 — Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher JTu3A.11 Frontiers in Optics (FiO) Previous Article Next ...
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Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ...
Development of an In-situ Metrology Technique for Freeform Optics
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... Technique for Freeform Optics. Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher.
Weighted spline based integration for reconstruction of freeform...
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Kamal K. Pant, Dali R. Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher. Author Information ...
Experimental investigations on characterization of freeform wavefront...
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· Mohamed Bichra, Technische Univ. Ilmenau (Germany). Gufran Sayeed Khan, Instrument Design Development Ctr. (India) Stefan Sinzinger ...
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Design considerations for the absolute testing approach of ...OUCI
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Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. https://doi.org ao · , Applied Optics, № 5, p ... Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. https://doi.org ao · , Applied Optics, № 5, p ...
Development of metrology for freeform optics in reflection ...Grow Kudos
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Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI: Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI:
Development of metrology for freeform optics in reflection ...SPIEDigitalLibrary.org
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von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra, von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra,1 ...
Experimental investigations on characterization of freeform ...SPIEDigitalLibrary.org
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von DR Burada · · Zitiert von: 35 — ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher "Experimental investigations on characterization of freeform ... von DR Burada · · Zitiert von: 35 — ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher "Experimental investigations on characterization of freeform ...
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Mohamed Bichra, N.Sabitov, Kamal K. Pant, Dali R. Burada, Gufran S. Khan, Stefan Sinzinger, Subaperture wavefront measurement using Talbot interferometry ... Mohamed Bichra, N.Sabitov, Kamal K. Pant, Dali R. Burada, Gufran S. Khan, Stefan Sinzinger, Subaperture wavefront measurement using Talbot interferometry ...
Subaperture stitching for measurement of freeform wavefrontNational Institutes of Health (NIH) (.gov)
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von KK Pant · · Zitiert von: 55 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Mahendra P Singh, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra ... von KK Pant · · Zitiert von: 55 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Mahendra P Singh, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra ...
Weighted spline based integration for reconstruction of ...National Institutes of Health (NIH) (.gov)
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von KK Pant · · Zitiert von: 15 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra Shakher. PMID ... von KK Pant · · Zitiert von: 15 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra Shakher. PMID ...
Fig. 1. Citation Kamal K. Pant, Dali R. Burada, Mohamed Bichra ...imagebank.osa.org › getExport
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Kamal K. Pant, Dali R. Burada, Mohamed Bichra, Mahendra P. Singh, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher, "Subaperture ...
Advanced Optical Technologies | Standard Journal ...Academic Accelerator
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Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ... Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ...
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17:30: Development of metrology for freeform optics in reflection mode, Dali R. Burada, Kamal K. Pant, Vinod Mishra, Indian Institute of Technology Delhi (India); Mohamed Bichra, Technische Univ. Ilmenau (Germany); Gufran S. Khan, Indian Institute of Technology Delhi (India); Stefan Sinzinger, Technische Univ. Ilmenau ...
Experimental investigations on characterization of freeform wavefront...
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Dali R. Burada, Kamal K. Pant, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +.
Freeform optics - BibliographiesGrafiati
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— Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher. "Development of a metrology technique — Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher. "Development of a metrology technique ...
Zeitschriftenartikel: „Manufacturing metrology“Grafiati
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— Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger und Chandra Shakher. „Development of a metrology technique suitable — Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger und Chandra Shakher. „Development of a metrology technique suitable ...
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