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Optical Measurement Systems for Industrial Inspection XStanford SearchWorks
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Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ...
ADVANCED OPTICAL TECHNOLOGIESDe Gruyter
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Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ...
SPIE Proceedings [SPIE SPIE Optical Metrology Munich, Germany...
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Parallelized chromatic confocal sensor systems Matthias Hillenbrand*, Adrian Grewe, Mohamed Bichra, Roman Kleindienst, Lucia Lorenz, Raoul Kirner, Robert Weiß,...
Illumination concepts for integrated optical sensors
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Mohamed Bichra, Xinrui Cao, Jaka Pribosek, Stefan Sinzinger Technische Universität Ilmenau, Germany. Find other works by these authors. M Bichra · X Cao · J Pribosek · S Sinzinger. Advanced Photonics (IPR, NOMA, Sensors, Networks, SPPCom, SOF); OSA Technical Digest (online) (Optical Society of America, ...
World of Photonics Congress 2015Proceedings.com
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Mohamed Bichra. Technische Universität Ilmenau. We present a new method for optical shape measurement of refractive surfaces. The concept is based on ... Mohamed Bichra. Technische Universität Ilmenau. We present a new method for optical shape measurement of refractive surfaces. The concept is based on ...
advanced optical technologiesProQuest
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von M Pfeffer — Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ... von M Pfeffer — Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ...
Illumination concepts for integrated optical sensorsOUCI
ouci.dntb.gov.ua
Authors: Mohamed Bichra, Xinrui Cao, Jaka Pribosek, Stefan Sinzinger. List of references. Leith, IEEE J. of Sel. Top. Quant. Electr., № 6, с https://doi ... Authors: Mohamed Bichra, Xinrui Cao, Jaka Pribosek, Stefan Sinzinger. List of references. Leith, IEEE J. of Sel. Top. Quant. Electr., № 6, с https://doi ...
Dr.-Ing. Dipl.-Ing. Mohamed BichraLinkedIn · Dr.-Ing. Dipl.-Ing. Mohamed Bichra4 Reaktionen · vor 1 Monat
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Dr.-Ing. Dipl.-Ing. Mohamed Bichra's Post · More Relevant Posts · Gruppenleitung Optical Models & Algorithms Illumination (m/w/x) · Explore topics. Dr.-Ing. Dipl.-Ing. Mohamed Bichra's Post · More Relevant Posts · Gruppenleitung Optical Models & Algorithms Illumination (m/w/x) · Explore topics.
Advanced Optical Technologies | Standard Journal ...Academic Accelerator
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Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ... Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ...
DIGITAL OPTICAL TECHNOLOGIES - PDF Free Download
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17:30: Development of metrology for freeform optics in reflection mode, Dali R. Burada, Kamal K. Pant, Vinod Mishra, Indian Institute of Technology Delhi (India); Mohamed Bichra, Technische Univ. Ilmenau (Germany); Gufran S. Khan, Indian Institute of Technology Delhi (India); Stefan Sinzinger, Technische Univ. Ilmenau ...
SPIE Optical Metrology (Twitter) - PDF Free Download
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16:30: New method for optical shape measurement of refractive surfaces, Mohamed Bichra, Florian Schurig, Stefan Sinzinger, Technische Univ. Ilmenau ...
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