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Kurs zukunftsfähige UniversitätTechnische Universität Ilmenau
www.tu-ilmenau.de
— Silber gab es für Mohamed Bichra, Nail. Sabitov und Professor Stefan Sinzinger vom Fachgebiet Technische Optik für ein. „Innovatives — Silber gab es für Mohamed Bichra, Nail. Sabitov und Professor Stefan Sinzinger vom Fachgebiet Technische Optik für ein. „Innovatives ...
Optical Measurement Systems for Industrial Inspection XStanford SearchWorks
searchworks.stanford.edu
Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ...
Development of an Innovative Metrology Technique for Freeform ...Google Books
books.google.com
Mohamed Bichra. Contributors, Stefan Sinzinger, Eberhard Manske, Martin Hoffmann. Publisher, Technische Universität Ilmenau. Export Citation, BiBTeX EndNote ... Mohamed Bichra. Contributors, Stefan Sinzinger, Eberhard Manske, Martin Hoffmann. Publisher, Technische Universität Ilmenau. Export Citation, BiBTeX EndNote ...
ADVANCED OPTICAL TECHNOLOGIESDe Gruyter
www.degruyter.com
Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger and Chandra Shakher. Development of a metrology technique suitable for in situ measurement and ...
Vorrichtung und Verfahren zur Vermessung zumindest teilweise...
books.google.de
Vorrichtung und Verfahren zur Vermessung zumindest teilweise reflektierender Oberflächen. Front Cover. Mohamed Bichra, Nail Sabitov, Stefan Sinzinger.
Investigations on sub-aperture stitching approach for ...Optica Publishing Group
opg.optica.org
von M Bichra · · Zitiert von: 1 — Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher JTu3A.11 Frontiers in Optics (FiO) Previous Article Next ... von M Bichra · · Zitiert von: 1 — Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher JTu3A.11 Frontiers in Optics (FiO) Previous Article Next ...
Method and apparatus for detecting the surface shape of ...Optica Publishing Group
opg.optica.org
von M Bichra · — Mohamed Bichra, Florian Schurig, and Stefan Sinzinger. Author Information. Author Affiliations. Mohamed Bichra,* Florian Schurig, and Stefan Sinzinger. von M Bichra · — Mohamed Bichra, Florian Schurig, and Stefan Sinzinger. Author Information. Author Affiliations. Mohamed Bichra,* Florian Schurig, and Stefan Sinzinger.
Patents Publications Book Chapters Conference Papersdokumen.tips
dokumen.tips
Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ...
Wavefront sensing by numerical evaluation of diffracted ...Optica Publishing Group
opg.optica.org
von M Bichra · · Zitiert von: 5 — Mohamed Bichra, Nail Sabitov, Thomas Meinecke, and Stefan Sinzinger. Author Information. Author Affiliations. Mohamed Bichra,* Nail Sabitov, Thomas Meinecke ... von M Bichra · · Zitiert von: 5 — Mohamed Bichra, Nail Sabitov, Thomas Meinecke, and Stefan Sinzinger. Author Information. Author Affiliations. Mohamed Bichra,* Nail Sabitov, Thomas Meinecke ...
Page UNI_01_2015
www4.tu-ilmenau.de
Silber gab es für Mohamed Bichra, Nail Sabitov und Professor Stefan Sinzinger vom Fachgebiet Technische Optik für ein „Innovatives Messsystem zur optischen Formerfassung glänzender glatter Freiformoberflächen.“ Eine weitere Silbermedaille ging an die Gruppe um Professor Jean Pierre Bergmann vom Fachgebiet Fertigungstechnik mit René ...
(PDF) Wavefront Sensing by Numerical Evaluation ofAmanote Research
research.amanote.com
Wavefront Sensing by Numerical Evaluation of Diffracted Wavefields by Mohamed Bichra, Nail Sabitov, Thomas Meinecke, Stefan Sinzinger published in. Wavefront Sensing by Numerical Evaluation of Diffracted Wavefields by Mohamed Bichra, Nail Sabitov, Thomas Meinecke, Stefan Sinzinger published in.
Experimental investigations on characterization of freeform wavefront...
spie.org
· Mohamed Bichra, Technische Univ. Ilmenau (Germany). Gufran Sayeed Khan, Instrument Design Development Ctr. (India) Stefan Sinzinger ...
Verfahren und Vorrichtung zur chromatisch-konfokalen ...Google Patents
patents.google.com
Mohamed Bichra: Roman Kleindienst: Stefan Sinzinger; Current Assignee. The listed assignees may be inaccurate. Google has not performed a legal analysis and ... Mohamed Bichra: Roman Kleindienst: Stefan Sinzinger; Current Assignee. The listed assignees may be inaccurate. Google has not performed a legal analysis and ...
Vorrichtung und Verfahren zur Vermessung zumindest teilweise ...Google Patents
patents.google.com
Mohamed Bichra: Nail Sabitov: Stefan Sinzinger; Current Assignee. The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no ... Mohamed Bichra: Nail Sabitov: Stefan Sinzinger; Current Assignee. The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no ...
Design considerations for the absolute testing approach of ...OUCI
ouci.dntb.gov.ua
Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. https://doi.org ao · , Applied Optics, № 5, p ... Burada, Mohamed Bichra, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. https://doi.org ao · , Applied Optics, № 5, p ...
Development of a metrology technique suitable for in situ ...EBSCO Information Services
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von DR Burada · · Zitiert von: 14 — Mohamed Bichra and Stefan Sinzinger: Fachgebiet Technische. Optik ... Mohamed Bichra studied micro and medical technology with a par- ticular ... von DR Burada · · Zitiert von: 14 — Mohamed Bichra and Stefan Sinzinger: Fachgebiet Technische. Optik ... Mohamed Bichra studied micro and medical technology with a par- ticular ...
Development of metrology for freeform optics in reflection ...Grow Kudos
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Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI: Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI:
Development of metrology for freeform optics in reflection ...SPIEDigitalLibrary.org
www.spiedigitallibrary.org
von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra, von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra,1 ...
Experimental investigations on characterization of freeform ...SPIEDigitalLibrary.org
www.spiedigitallibrary.org
von DR Burada · · Zitiert von: 35 — ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher "Experimental investigations on characterization of freeform ... von DR Burada · · Zitiert von: 35 — ... Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher "Experimental investigations on characterization of freeform ...
Freeform characterization based on nanostructured diffraction ...Ruhr-Universität Bochum
bibliographie.ub.rub.de
Mohamed Bichra,; Thomas Meinecke,; Patrick Feßer,; Lutz Müller,; Martin Hoffmann · ORCID. RUB Icon. ,; Stefan Sinzinger in Applied optics, Volume 57, ... Mohamed Bichra,; Thomas Meinecke,; Patrick Feßer,; Lutz Müller,; Martin Hoffmann · ORCID. RUB Icon. ,; Stefan Sinzinger in Applied optics, Volume 57, ...
Hybrid hyperchromats for chromatic confocal sensor systemsFrontiers
www.frontiersin.org
von M Hillenbrand · Zitiert von: 41 — Patrick Fe ß er 1, Mohamed Bichra 1 and. Stefan Sinzinger Fachgebiet Technische Optik , IMN MacroNano ® ,. Technische Universit ä t Ilmenau, Ilmenau ... von M Hillenbrand · Zitiert von: 41 — Patrick Fe ß er 1, Mohamed Bichra 1 and. Stefan Sinzinger Fachgebiet Technische Optik , IMN MacroNano ® ,. Technische Universit ä t Ilmenau, Ilmenau ...
Illumination concepts for integrated optical sensorsOUCI
ouci.dntb.gov.ua
Authors: Mohamed Bichra, Xinrui Cao, Jaka Pribosek, Stefan Sinzinger. List of references. Leith, IEEE J. of Sel. Top. Quant. Electr., № 6, с https://doi ... Authors: Mohamed Bichra, Xinrui Cao, Jaka Pribosek, Stefan Sinzinger. List of references. Leith, IEEE J. of Sel. Top. Quant. Electr., № 6, с https://doi ...
Publications - Web IITD Sites - IIT DelhiIIT Delhi
web.iitd.ac.in
Mohamed Bichra, N.Sabitov, Kamal K. Pant, Dali R. Burada, Gufran S. Khan, Stefan Sinzinger, Subaperture wavefront measurement using Talbot interferometry ... Mohamed Bichra, N.Sabitov, Kamal K. Pant, Dali R. Burada, Gufran S. Khan, Stefan Sinzinger, Subaperture wavefront measurement using Talbot interferometry ...
Subaperture stitching for measurement of freeform wavefrontNational Institutes of Health (NIH) (.gov)
pubmed.ncbi.nlm.nih.gov
von KK Pant · · Zitiert von: 55 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Mahendra P Singh, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra ... von KK Pant · · Zitiert von: 55 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Mahendra P Singh, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra ...
Weighted spline based integration for reconstruction of ...National Institutes of Health (NIH) (.gov)
pubmed.ncbi.nlm.nih.gov
von KK Pant · · Zitiert von: 15 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra Shakher. PMID ... von KK Pant · · Zitiert von: 15 — Authors. Kamal K Pant, Dali R Burada, Mohamed Bichra, Amitava Ghosh, Gufran S Khan, Stefan Sinzinger, Chandra Shakher. PMID ...
Fig. 1. Citation Kamal K. Pant, Dali R. Burada, Mohamed Bichra ...imagebank.osa.org › getExport
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Kamal K. Pant, Dali R. Burada, Mohamed Bichra, Mahendra P. Singh, Amitava Ghosh, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher, "Subaperture ...
Fig Citation Mohamed Bichra, Nail Sabitov, Thomas ...imagebank.osa.org › getExport
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Mohamed Bichra, Nail Sabitov, Thomas Meinecke, Stefan Sinzinger, "Wavefront sensing by numerical evaluation of diffracted wavefields," Appl. Opt. 56, ...
Wavefront sensing by numerical evaluation of diffracted …
lux.leuphana.de
Wavefront sensing by numerical evaluation of diffracted wavefields / Mohamed Bichra, Nail Sabitov, Thomas Meinecke, and Stefan Sinzinger . A novel wavefront sensor principle based on diffraction theory and Fourier analysis with a modified angular spectrum propagator has been developed. We observe the propagation of a wavefront behind a two ...
Advanced Optical Technologies | Standard Journal ...Academic Accelerator
academic-accelerator.com
Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ... Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ...
DIGITAL OPTICAL TECHNOLOGIES - PDF Free Download
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17:30: Development of metrology for freeform optics in reflection mode, Dali R. Burada, Kamal K. Pant, Vinod Mishra, Indian Institute of Technology Delhi (India); Mohamed Bichra, Technische Univ. Ilmenau (Germany); Gufran S. Khan, Indian Institute of Technology Delhi (India); Stefan Sinzinger, Technische Univ. Ilmenau ...
Parallelized chromatic confocal sensor systemsSPIE Digital Library
www.spiedigitallibrary.org
von M Hillenbrand · · Zitiert von: 19 — Matthias Hillenbrand*, Adrian Grewe, Mohamed Bichra, Roman Kleindienst, Lucia Lorenz, Raoul. Kirner, Robert Weiß, Stefan Sinzinger. Technische Universität ... von M Hillenbrand · · Zitiert von: 19 — Matthias Hillenbrand*, Adrian Grewe, Mohamed Bichra, Roman Kleindienst, Lucia Lorenz, Raoul. Kirner, Robert Weiß, Stefan Sinzinger. Technische Universität ...
Experimental investigations on characterization of freeform wavefront...
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Dali R. Burada, Kamal K. Pant, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +.
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