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Optical Measurement Systems for Industrial Inspection XStanford SearchWorks
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Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher; Deformation measurements by ESPI of the surface of a heated mirror and ...
Investigations on sub-aperture stitching approach for ...Optica Publishing Group
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von M Bichra · · Zitiert von: 1 — Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher JTu3A.11 Frontiers in Optics (FiO) Previous Article Next ... von M Bichra · · Zitiert von: 1 — Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher JTu3A.11 Frontiers in Optics (FiO) Previous Article Next ...
Patents Publications Book Chapters Conference Papersdokumen.tips
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Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ... Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger,. and Chandra Shakher. "Development of an In-situ Metrology Technique for Freeform ...
Development of an In-situ Metrology Technique for Freeform Optics
opg.optica.org
... Technique for Freeform Optics. Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, and Chandra Shakher.
Development of metrology for freeform optics in reflection ...Grow Kudos
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Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI: Dali R. Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. June 2017, SPIE. DOI:
Development of metrology for freeform optics in reflection ...SPIEDigitalLibrary.org
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von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra, von DR Burada · · Zitiert von: 9 — ... Mohamed Bichra, Gufran S. Khan, Stefan Sinzinger, Chandra Shakher. Author Affiliations +. Dali R. Burada,1 Kamal K. Pant,1 Vinod Mishra,1 ...
Advanced Optical Technologies | Standard Journal ...Academic Accelerator
academic-accelerator.com
Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ... Pant · Vinod Mishra · Mohamed Bichra · Gufran S. Khan · Stefan Sinzinger · Chandra Shakher · High-resolution headlamps – technology analysis and system design ...
DIGITAL OPTICAL TECHNOLOGIES - PDF Free Download
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17:30: Development of metrology for freeform optics in reflection mode, Dali R. Burada, Kamal K. Pant, Vinod Mishra, Indian Institute of Technology Delhi (India); Mohamed Bichra, Technische Univ. Ilmenau (Germany); Gufran S. Khan, Indian Institute of Technology Delhi (India); Stefan Sinzinger, Technische Univ. Ilmenau ...
Freeform optics - BibliographiesGrafiati
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— Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher. "Development of a metrology technique — Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger, and Chandra Shakher. "Development of a metrology technique ...
Zeitschriftenartikel: „Manufacturing metrology“Grafiati
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— Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger und Chandra Shakher. „Development of a metrology technique suitable — Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan, Stefan Sinzinger und Chandra Shakher. „Development of a metrology technique suitable ...
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