Phys. Rev. B 94, (R) (2016) - Deep electron and hole polarons...
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Moloud Kaviani, Jack Strand, Valery V. Afanas'ev, and Alexander L. Shluger. Phys. Rev. B 94, (R) – Published 21 July More. ×.
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Alexander Shluger 1,2, David Z. Gao 1, Jack Strand 1, Moloud Kaviani 2, Adnan Mehonic 1, and Anthony Kenyon University College London, UK 2 Tohoku University, Sendai, Japan RR :55-12:20 Modelling of Resistive Switching Devices based on the Valence Change Mechanism. S. Menzel 1, C. Funck 2, C. La Torre 2, A. Marchewka 2, K. Fleck 2, C. Bäumer 1, V. Rana 1, S. Hoffmann-Eifert 1, …
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Moloud Kaviani, Jack Strand, Valery V. Afanas'ev and Alexander L. Shluger. Phys. Rev. B, 2016, 94. DOI: PhysRevB Quantum beats at the metal/organic interface. Benjamin W. Caplins, David E. Suich, Alex J. Shearer and Charles B. Harris. Journal of Electron Spectroscopy and Related Phenomena, ...
"Role of carrier injection in degradation of amorphous oxide films"...
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Recommended Citation. Alexander Shluger, David Gao, Jack Strand, Oliver Dicks, and Moloud Kaviani, "Role of carrier injection in degradation of amorphous ...
Basic research on ionic-covalent materials for nuclear applications |...
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Authors : Alexander Shluger, Al-Moatasem El-Sayed, Jack Strand, Moloud Kaviani, Oliver Dicks, David Z. Gao Affiliations : Department of Physics and Astronomy ...
Effect of end group of amorphous perfluoro-polymer electrets on...
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Jack Strand, Moloud Kaviani, Valeri V Afanas'ev, Judit G Lisoni, Alexander L Shluger Nanotechnology March 23, 29 (12): Make the most of Read.
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Alexander Shluger, David Gao, Jack Strand, Oliver Dicks, and Moloud Kaviani, Role of carrier injection in degradation of amorphous oxide films in International ...
Intrinsic charge trapping in amorphous oxide films: status and...
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Intrinsic charge trapping in amorphous oxide films: status and challenges. Jack Strand, Moloud Kaviani, David Gao, Al-Moatasem El-Sayed, Valeri V Afanas'ev, ...
Intrinsic electron trapping in amorphous oxide | Read by QxMD
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Intrinsic electron trapping in amorphous oxide. Jack Strand, Moloud Kaviani, Valeri V Afanas'ev, Judit G Lisoni, Alexander L Shluger. Nanotechnology
International Conference on Semiconductor Technology for Ultra-Large...
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Role of carrier injection in degradation of amorphous oxide films, Alexander Shluger, David Gao, Jack Strand, Oliver Dicks, and Moloud Kaviani (Abstract). PDF.
Altmetric – Intrinsic charge trapping in amorphous oxide films:...
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Jack Strand, Moloud Kaviani, David Gao, Al-Moatasem El-Sayed, Valeri V Afanas 'ev, Alexander L Shluger. Abstract. We review the current understanding of ...
Intrinsic charge trapping in amorphous oxide films PubMedpubmed.ncbi.nlm.nih.gov › ...
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Authors. Jack Strand , Moloud Kaviani, David Gao, Al-Moatasem El-Sayed, Valeri V Afanas'ev, Alexander L Shluger ...
Altmetric – Intrinsic electron trapping in amorphous oxide
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Jack Strand, Moloud Kaviani, Valeri V Afanas'ev, Judit G Lisoni, Alexander L Shluger. Abstract. We demonstrate that electron trapping at intrinsic precursor sites ...
NAVER 학술정보 > Intrinsic electron trapping in amorphous oxide.
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Author: Jack Strand, Moloud Kaviani, Valeri V Afanas'ev, Judit G Lisoni, Alexander L Shluger; Publisher: (2018)Medline; Citations: 1; Partners ...
ULSIC vs TFT: 6 th International Conference on Semiconductor...
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... films Alexander Shluger, University College London, United Kingdom David Gao, Jack Strand, Oliver Dicks, University College London, United Kingdom; Moloud Kaviani, WPI-Advanced Institute for Materials Research, Japan 14:30-15:00 Equilibrium mobility in IGZO TFT: Existence of the intermediate boolchand phase?
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