Contact - Chair of Computer EngineeringBrandenburgische Technische Universität Cottbus-Senftenberg
www.b-tu.de
— Dr. Raimund Ubar or Prof. Dr. Peter Ellervee or Prof. Dr. Jaan Raik or Dr. Maksim Jenihhin Tallinn University of Technology, Estonia.
Teaching - Leandro Soares Indrusiak - University of YorkUniversity of York
lsi500.hosted.york.ac.uk
Hosted by Peeter Ellervee, Gert Jervan, Jaan Raik and Raimund Ubar Actor-oriented design. University of Montpellier II, France (funded by Université ...
Design and Test Technology for Dependable Systems-on- ...Barnes & Noble
www.barnesandnoble.com
Design and Test Technology for Dependable Systems-on-Chip. by Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus
Design and Test Technology for Dependable Systems-on-chipgoogle.com
books.google.com
Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus. Chapter 11 Self-Repair by Program Reconfiguration in VLIW Processor Architectures.
Proceedings of the Estonian Academy of Sciences, Engineeringgoogle.com
books.google.com
... Priidu PAOMETS, Jaan RAIK, and Raimund UBAR Department of Computer Engineering, Tallinn Technical University, Ehitajate tee 5, EE Tallinn, Estonia; ...
Proceedings of the Estonian Academy of Sciences, Engineering - Google...
books.google.de
... Gert JERVAN, Antti MARKUS, Priidu PAOMETS, Jaan RAIK, and Raimund UBAR Department of Computer Engineering, Tallinn Technical University, Ehitajate ...
Digitala Vetenskapliga ArkivetDiVA portal
www.diva-portal.org
von A Larsson · — (English)In: Design and Test Technology for Dependable Systems-on-chip / [ed] Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ...
Representing Gate-Level SET Faults by Multiple SEU ...arXiv
arxiv.org
von AC Bagbaba · · Zitiert von: 3 — Representing Gate-Level SET Faults by Multiple SEU Faults at RTL. Authors:Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer. von AS Oyeniran · · Zitiert von: 2 — Authors:Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik. Download a PDF of the paper titled Mixed-level ...
Cycle-Based Simulation Algorithms for Digital Systems ...DATE conferences
past.date-conference.com
von A Morawiec · Zitiert von: 5 — Cycle-Based Simulation Algorithms for Digital Systems Using High-Level Decision Diagrams. Adam Morawiec. 1. , Raimund Ubar. 2. , Jaan Raik.
On Test Generation for Microprocessors for Extended ...Archive ouverte HAL
hal.science
von A Oyeniran · · Zitiert von: 2 — On Test Generation for Microprocessors for Extended Class of Functional Faults. Adeboye Oyeniran 1Raimund Ubar 1 Maksim Jenihhin 1 Jaan Raik 1. Détails.
12th IEEE European Test Symposium
ets07.informatik.uni-freiburg.de
Jaan RAIK · Raimund UBAR · Vineeth GOVIND : Tallinn University of Technology, Estonia. Optimization of NoC Wrapper Design Under Bandwidth and Test ...
AGRA - Publikationen - Buchbeträge
www.informatik.uni-bremen.de
Herausgeber: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus. Buchtitel: Design and Test Technology for Dependable Systems-on-Chip. Verlag ...
Heinz Nixdorf Institut: Seminar: Self-repair of SoCs and NoC-based...
www.hni.uni-paderborn.de
... E. Stroud, and Nur A. Touba; "Design and Test Technology for Dependable Systems-on-Chip" by Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus.
Diagnostic Modelling of Digital Systems with Binary and ...Springer
link.springer.com
von R Ubar · — Diagnostic Modelling of Digital Systems with Binary and High-Level Decision Diagrams. Raimund Ubar,; Jaan Raik, ...
Reseeding using compaction of pre-generated LFSR sub ...researchr.org
researchr.org
Artur Jutman, Igor Aleksejev, Jaan Raik, Raimund Ubar. Reseeding using compaction of pre-generated LFSR sub-sequences. In 15th IEEE International Conference ...
Alle Infos zum Namen "Raimund Ubar"
A New Testability Calculation Method to Guide RTL Test ...OA.mg
oa.mg
Read and download A New Testability Calculation Method to Guide RTL Test Generation by Jaan Raik, Tanel Nõmmeots, Raimund Ubar on OA.mg.
Cycle-based simulation with decision diagramsAcademia.edu
www.academia.edu
Profile image of Raimund Ubar Raimund Ubar , Design, Automation and Test in Europe Conference and Exhibition, Proceedings (Cat. No. PR00078). On reusability of verification assertions for testing Maksim Jenihhin, Jaan Raik, Raimund Ubar, Anton Chepurov Dept. of Computer Engineering, ...
On Test Generation for Microprocessors for Extended ...Inserm
www.hal.inserm.fr
von AS Oyeniran · · Zitiert von: 2 — Adeboye Stephen Oyeniran 1Raimund Ubar 1 Maksim Jenihhin 1 Jaan Raik 1. Details. 1 TTÜ - Tallinn University of Technology.
Code Coverage Analysis for Concurrent Programming Languages Using...
hal.archives-ouvertes.fr
Maksim Jenihhin, Jaan Raik, Anton Chepurov, Uljana Reinsalu, Raimund Ubar. Code Coverage Analysis for Concurrent Programming Languages Using ...
Testing Strategies for Networks on ChipInfona.pl
www.infona.pl
von R Ubar · Zitiert von: 39 — Testing Strategies for Networks on Chip. Raimund Ubar, Jaan Raik · Details · Contributors · Bibliography · Quotations · Similar · Collections ...
EAP - Estonian Journal of Engineering Publications
kirj.ee
Authors. Anton Karputkin, Raimund Ubar, Jaan Raik, Mati Tombak. Abstract. In this paper we give a short overview of the decision diagrams, and define a ...
CiteSeerX — Parallel Fault Backtracing for Calculation of Fault...
citeseerx.ist.psu.edu
author = {Raimund Ubar and Sergei Devadze and Jaan Raik and Artur Jutman}, title = {Parallel Fault Backtracing for Calculation of Fault Coverage}, year = {} } ...
Verwandte Suchanfragen zu Raimund Ubar
| Theodor Vierhaus Heinrich Theodor Vierhaus Gert Jervan | Artur Jutman Dieter Bochmann |
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