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Infrared Photoluminescence Research ArticlesR Discovery
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Sara Kochoska + 6 · Read Paper · Passive atomic-scale optical sensors for mapping light flux in ultra-small cavities. Understanding light propagation and ... Sara Kochoska + 6 · Read Paper · Passive atomic-scale optical sensors for mapping light flux in ultra-small cavities. Understanding light propagation and ...
PCIM EuropeOnsemi
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onsemi author and speaker: Sara Kochoska. A Modelling Approach Towards High Power Module Design. onsemi author and speaker: Roveendra Paul. Thursday May 11. onsemi author and speaker: Sara Kochoska. A Modelling Approach Towards High Power Module Design. onsemi author and speaker: Roveendra Paul. Thursday May 11.
Netzwerk-Profile
LinkedIn: Sara Kochoska - Characterisation Engineer - ON Semiconductor ...
Sehen Sie sich das Profil von Sara Kochoska auf LinkedIn an, dem weltweit größten beruflichen Netzwerk. 3 Jobs sind im Profil von Sara Kochoska aufgelistet.
Business-Profile
Xing: Sara Kochoska
International Automotive Engineering / Ingolstadt / ANSYS Electronics (Q3D), ANSYS Maxwell, MATLAB Simulink / , Technische Hochschule Ingolstadt
Ausbildung
Power Semiconductor Devices and ICs (ISPSD), th ...Scholars Portal Journals
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Sara Kochoska · Jaume Roig Guitart · Lukas Richert · Basil Vlachakis. Source Information. May 2023, IssueCompletePages, p.246To Abstract. SiC MOSFETs ... Sara Kochoska · Jaume Roig Guitart · Lukas Richert · Basil Vlachakis. Source Information. May 2023, IssueCompletePages, p.246To Abstract. SiC MOSFETs ...
Bücher
Sara Kochoska | 3 Publications | 2 Citations | Related AuthorsAI Chat for scientific PDFs | SciSpace
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Sara Kochoska is an academic researcher. The author has contributed to research in topics: Stress (linguistics) & Electroluminescence. Sara Kochoska is an academic researcher. The author has contributed to research in topics: Stress (linguistics) & Electroluminescence.
Hrishikesh Das | Mississippi State University | 23 PublicationsAI Chat for scientific PDFs | SciSpace
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Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations · Sara Kochoska, ... Sara Kochoska,Martin ... Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations · Sara Kochoska, ... Sara Kochoska,Martin ...
Dokumente zum Namen
th International Symposium on Power Semiconductor ...Proceedings.com
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Sara Kochoska, Jaume Roig Guitart, Lukas Richert, Basil Vlachakis. ON Semiconductor Corporation. 15:15. Investigations of Residual Damage in SiC Trench MOSFETs ... Sara Kochoska, Jaume Roig Guitart, Lukas Richert, Basil Vlachakis. ON Semiconductor Corporation. 15:15. Investigations of Residual Damage in SiC Trench MOSFETs ...
International Exhibition and Conference for Power Electronics, ...Proceedings.com
www.proceedings.com
Sara Kochoska. PP104 Improved Power Cycling Reliability through the use of SmartSiC Engineered Substrate for Power Devices Sara Kochoska. PP104 Improved Power Cycling Reliability through the use of SmartSiC Engineered Substrate for Power Devices ...
International Exhibition & Conference for Power Electronics ...Proceedings.com
www.proceedings.com
Sara Kochoska, Thomas Neyer, Kyeongseok Park SILICON AND SIC HYBRID SWITCH PERFORMANCE IN THE ADVANCED. NEUTRAL POINT CLAMP (ANPC) TOPOLOGY BASED POWER ... Sara Kochoska, Thomas Neyer, Kyeongseok Park SILICON AND SIC HYBRID SWITCH PERFORMANCE IN THE ADVANCED. NEUTRAL POINT CLAMP (ANPC) TOPOLOGY BASED POWER ...
Table of Content PCIM Europe 2023PCIM Europe
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Sara Kochoska, Lukas Richert, onsemi, D; Jaume Roig Guitart, Basil Vlachakis, onsemi, B. PP104. Improved Power Cycling Reliability through the use of SmartSiC ... Sara Kochoska, Lukas Richert, onsemi, D; Jaume Roig Guitart, Basil Vlachakis, onsemi, B. PP104. Improved Power Cycling Reliability through the use of SmartSiC ...
Wissenschaftliche Veröffentlichungen
Defect and diffusion forum/Diffusion and defect data, solid ...TU Dortmund
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... Sara Kochoska, Daeeun An The Role of Defects on SiC Device Performance and Ways to Mitigate them Defect and diffusion forum/Diffusion and defect data, solid Sara Kochoska, Daeeun An The Role of Defects on SiC Device Performance and Ways to Mitigate them Defect and diffusion forum/Diffusion and defect data, solid ...
Veröffentlichungen allgemein
Conference Programicscrm 2023
icscrm-2023.org
— Mo.C.7 Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham,. Swapna Sunkari, Joshua Justice and Hrishikesh Das — Mo.C.7 Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham,. Swapna Sunkari, Joshua Justice and Hrishikesh Das ...
PCIM_Europe_digital_days_Con...drivemode-h2020.eu
drivemode-h2020.eu
— Sara Kochoska, Thomas Neyer, ON Semiconductor, D; Kyeongseok Park, ON. Seminconductor, ROK. Page 9. PP021. Silicon and SiC Hybrid Switch — Sara Kochoska, Thomas Neyer, ON Semiconductor, D; Kyeongseok Park, ON. Seminconductor, ROK. Page 9. PP021. Silicon and SiC Hybrid Switch ...
Artikel & Meinungen
Top 334 Materials Science Forum papers published in 2023AI Chat for scientific PDFs | SciSpace
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Sara Kochoska, Martin Domeij, Thanh-Toan Pham, S. Maslougkas, Swapna Sunkari, J. Justice, Hrishikesh Das - Show less +3 more. 04 Jun Materials Science ... Sara Kochoska, Martin Domeij, Thanh-Toan Pham, S. Maslougkas, Swapna Sunkari, J. Justice, Hrishikesh Das - Show less +3 more. 04 Jun Materials Science ...
Sonstiges
Sara Kochoska's research worksResearchGate
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Sara Kochoska's 3 research works with 4 citations and 498 reads, including: Pulsed Forward Bias Body Diode Stress of v SiC MOSFETs with Individual ... Sara Kochoska's 3 research works with 4 citations and 498 reads, including: Pulsed Forward Bias Body Diode Stress of v SiC MOSFETs with Individual ...
Electroluminescence on ResearchHubResearchHub
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Sara Kochoska et al.Feb 1, Bipolar degradation is a known problem in the development of SiC MOSFETs when the body diodes (p+ body/ n-drift layer) are ... Sara Kochoska et al.Feb 1, Bipolar degradation is a known problem in the development of SiC MOSFETs when the body diodes (p+ body/ n-drift layer) are ...
th International Symposium on Power Semiconductor ...booksci.cn
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Gate Current Peaks Due to CGD Overcharge in SiC MOSFETs Under Short-Circuit Test. Pub Date : DOI: ISPSD Sara Kochoska, ... Gate Current Peaks Due to CGD Overcharge in SiC MOSFETs Under Short-Circuit Test. Pub Date : DOI: ISPSD Sara Kochoska, ...
Bodo's WBG - SiCBodo's Wide Bandgap Event
www.bodoswbg.com
Sara Kochoska: Staff Characterization Engineer SiC R&D Department: onsemi: The short-circuit (SC) performance of SiC power MOSFETs has been extensively ... Sara Kochoska: Staff Characterization Engineer SiC R&D Department: onsemi: The short-circuit (SC) performance of SiC power MOSFETs has been extensively ...
Drawings Gallery - .NATOnato70.mk
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Sara Kochoska. Sara Kostadinovska. Sara Rustemoska. Sara Spirova. Sara Tailovikj. Sara Kochoska. Sara Kostadinovska. Sara Rustemoska. Sara Spirova. Sara Tailovikj.
Find all citations of the publicationOUCI
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Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations. Sara Kochoska, Martin Domeij, Swapna Sunkari ... Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations. Sara Kochoska, Martin Domeij, Swapna Sunkari ...
Effects of Basal Plane Dislocations on SiC Power Device ReliabilityOUCI
ouci.dntb.gov.ua
Sara Kochoska, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. https://doi.org p-52e Sara Kochoska, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. https://doi.org p-52e
Gate Current Peaks Due to CGD Overcharge in SiC ...AI Chat for scientific PDFs | SciSpace
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... -Circuit Test. Sara Kochoska,Jaume Roig Guitart,Basil Vlachakis +2 more. - pp Show Less. Save. TL;DR: In this article , the authors investigate the Circuit Test. Sara Kochoska,Jaume Roig Guitart,Basil Vlachakis +2 more. - pp Show Less. Save. TL;DR: In this article , the authors investigate the ...
ON Semiconductor | Phoenix, United States |ResearchGate
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Sara Kochoska · Martin Domeij · Thanh Toan Pham; [...] Hrishikesh Das. Bipolar degradation is a known ... Sara Kochoska · Martin Domeij · Thanh Toan Pham; [...] Hrishikesh Das. Bipolar degradation is a known ...
ProgramEasyChair
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Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham, Swapna Sunkari, Joshua Justice and Hrishikesh Das. Body diode reliability ... Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham, Swapna Sunkari, Joshua Justice and Hrishikesh Das. Body diode reliability ...
Výsledky vyhledávání - "Xue-Qing Hu"Akademie věd
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4. Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations. Autor: Sara Kochoska, Martin Domeij Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations. Autor: Sara Kochoska, Martin Domeij ...
Pulsed Forward Bias Body Diode Stress of v SiC MOSFETs ...ResearchHub
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Sara Kochoska,Martin Domeij ... , Isafjordsgatan 32C, Kista, Sweden 3onsemi, 82 Running Hill Rd, South Portland, Maine, USA asara.kochoska ... Sara Kochoska,Martin Domeij ... , Isafjordsgatan 32C, Kista, Sweden 3onsemi, 82 Running Hill Rd, South Portland, Maine, USA asara.kochoska ...
Pulsed Forward Bias Body Diode Stress of v SiC MOSFETs ...Semantic Scholar
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Sara Kochoska, M. Domeij, +4 authors. H. Das · Published 5 June · Materials Science, Engineering, Physics · Materials Science Forum. Sara Kochoska, M. Domeij, +4 authors. H. Das · Published 5 June · Materials Science, Engineering, Physics · Materials Science Forum.
Pulsed Forward Bias Body Diode Stress of V SiC ...AMiner
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... Individual Mapping of Basal Plane Dislocations. Sara Kochoska,Martin Domeij， +7 authors. Xue Qing Hu,Thomas Neyer. Materials Science Forum（2022）. Cited 1| Individual Mapping of Basal Plane Dislocations. Sara Kochoska,Martin Domeij， +7 authors. Xue Qing Hu,Thomas Neyer. Materials Science Forum（2022）. Cited 1| ...
Sara KochoskaEasyChair
easychair.org
ICSCRM 2023: INTERNATIONAL CONFERENCE ON SILICON CARBIDE AND RELATED MATERIAL PROGRAMAUTHORSKEYWORDS. Sara Kochoska. Affiliation: ONSemi ... ICSCRM 2023: INTERNATIONAL CONFERENCE ON SILICON CARBIDE AND RELATED MATERIAL PROGRAMAUTHORSKEYWORDS. Sara Kochoska. Affiliation: ONSemi ...
SiC-2: Ruggedness & Reliability of SiC MOSFETs (Lecture)Epapers
epapers2.org
— Sara Kochoska, Jaume Roig Guitart, Lukas Richert, Basil Vlachakis · 5, Investigations of Residual Damage in SiC Trench MOSFETs After — Sara Kochoska, Jaume Roig Guitart, Lukas Richert, Basil Vlachakis · 5, Investigations of Residual Damage in SiC Trench MOSFETs After ...
Pulsed Forward Bias Body Diode Stress of v SiC ...Scientific.net
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von S Kochoska · — Sara Kochoska*, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. Keywords: 4H-SiC, Basal Plane ... von S Kochoska · — Sara Kochoska*, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. Keywords: 4H-SiC, Basal Plane ...
[PDF] Breaking the IGBT Eloss/VCEsat trade off relationship by...
www.semanticscholar.org
In this paper hybrid switches consisting either of high speed or low VCEsat Si IGBTs, connected in parallel with low current SiC MosFET, have been proposed as...
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