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Thilo Glatzel (Editor of Kelvin Probe Force Microscopy)
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Thilo Glatzel is the author of Kelvin Probe Force Microscopy (0.0 avg rating, 0 ratings, 0 reviews, published 2011) and Kelvin Probe Force Microscopy (0....
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This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous… lieferbar ab Buch. EUR 153,32*. Artikel merken. In den Warenkorb. Artikel ist im Warenkorb. Reinhard ...
Kelvin Probe Force Microscopy - From Single Charge Detection to ...www.springer.com › book
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Thilo Glatzel is leader of the force microscopy group which is part of the research group from Prof Facebook Twitter LinkedIn Google++ ...
Kelvin Probe Force Microscopy - Measuring and Compensating ...www.springer.com › book
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Facebook Twitter LinkedIn Google++ ... Sascha Sadewasser; Thilo Glatzel. Series Title: Springer Series in Surface Sciences; Series Volume:
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Thilo Glatzel University of Basel, Department of Physics, Klingelbergstr G.H. Enevoldsen, Th. Glatzel, M.C. Christensen, J.V. Lauritsen, F. Besenbacher ...
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This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an...
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Analytical Approach to the Local Contact Potential Difference on (001) Ionic Surfaces: Implications for Kelvin Probe Force Microscopy - Franck Bocquet
Book Review - Kelvin Probe Force Microscopywww.cambridge.org › services › aop-cambridge-core › content › view › k...
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Sascha Sadewasser and Thilo Glatzel (Eds.), Springer Series in Surface Sciences, Book 65, 2018, 521 pp. ISBN: Rüdiger Berger.
Kelvin Probe Force Microscopy - Measuring and…
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Sascha Sadewasser; Thilo Glatzel: Kelvin Probe Force Microscopy (2011) ISBN: Measuring and Compensating Electrostatic Forces, eBooks, ...
Implications for Kelvin Probe Force Microscopy - Archive ouverte HALhal.archives-ouvertes.fr › hal
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Franck Bocquet, Laurent Nony, Christian Loppacher, Thilo Glatzel. Analytical Approach to the Local Contact Potential Difference on (001) Ionic ...
Kelvin Probe Force Microscopy From Single Charge Detection to ...lib.ugent.be › catalog › ebk01:
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... Probe Force Microscopy [electronic resource] : From Single Charge Detection to Device Characterization / edited by Sascha Sadewasser, Thilo Glatzel.
Kelvin probe force microscopy and spectroscopy - Beilstein-Institutwww.beilstein-institut.de › talks › archive › kelvin-p...
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· Thilo Glatzel studied physics at the Free University of Berlin, at the Universitat Autònoma de Barcelona and with a Minerva Fellowship of ...
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