Thomas Kemen und Scanning - Info zur Person

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Hardware Trust and Assurance through Reverse EngineeringACM Digital Library

dl.acm.org

von UJ Botero · · Zitiert von: 94 — Anna Lena Keller, Dirk Zeidler, and Thomas Kemen High throughput data acquisition with a multi-beam SEM. In Scanning Microscopies 2014, Vol von UJ Botero · · Zitiert von: 94 — Anna Lena Keller, Dirk Zeidler, and Thomas Kemen High throughput data acquisition with a multi-beam SEM. In Scanning Microscopies 2014, Vol

Multiple-Beam Scanning Electron MicroscopyInternet Archive Scholar

scholar.archive.org

von AL Eberle · Zitiert von: 24 — Thomas Kemen, Nicole Rauwolf, and Gregor Dellemann for many insightful discussions. Figure 6: Test chip showing a hexagonal arrangement of calibration. von AL Eberle · Zitiert von: 24 — Thomas Kemen, Nicole Rauwolf, and Gregor Dellemann for many insightful discussions. Figure 6: Test chip showing a hexagonal arrangement of calibration.

Hardware Trust and Assurance through Reverse Engineering:University of Florida

dforte.ece.ufl.edu

von UJ BOTERO · · Zitiert von: 7 — [95] Anna Lena Keller, Dirk Zeidler, and Thomas Kemen High throughput data acquisition with a multi-beam SEM. In Scanning Microscopies 2014, Vol ... von UJ BOTERO · · Zitiert von: 7 — [95] Anna Lena Keller, Dirk Zeidler, and Thomas Kemen High throughput data acquisition with a multi-beam SEM. In Scanning Microscopies 2014, Vol ...

Multi-beam SEM technology for ultra-high throughputResearchGate

www.researchgate.net

Thomas Kemen. Conventional scanning electron microscopes are limited in their ultimate data acquisition rate at a given resolution by ... Thomas Kemen. Conventional scanning electron microscopes are limited in their ultimate data acquisition rate at a given resolution by ...

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High throughput data acquisition with a multi-beam SEMSPIE Digital Library

www.spiedigitallibrary.org

von AL Keller · · Zitiert von: 37 — , Thomas Kemen a a. Carl Zeiss Microscopy GmbHOberkochen, Germany. ABSTRACT. Conventional scanning electron microscopes are ... von AL Keller · · Zitiert von: 37 — , Thomas Kemen a a. Carl Zeiss Microscopy GmbHOberkochen, Germany. ABSTRACT. Conventional scanning electron microscopes are ...

arXiv: v1 [cs.DC] 6 Nov 2020Washington University in St. Louis

www.cse.wustl.edu

von R Vescovi · Zitiert von: 9 — [6] Anna Lena Keller, Dirk Zeidler, and Thomas Kemen. High throughput data acquisition with a multi-beam sem. In Scanning Microscopies von R Vescovi · Zitiert von: 9 — [6] Anna Lena Keller, Dirk Zeidler, and Thomas Kemen. High throughput data acquisition with a multi-beam sem. In Scanning Microscopies

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