Torsten Grüning und Udo Mahlstedt - Info zur Person

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Debug Automation from Pre-Silicon to Post-Silicon - Mehdi Dehbashi,...

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[GMK91] Torsten Grüning, Udo Mahlstedt, and Hartmut Koopmeiners. DIATEST: A fast diagnostic test pattern generator for combinational circuits. In Proceedings ...

A Formal Non-Heuristic ATPG ApproachInternet Archive Scholar

scholar.archive.org

von M Henftling · Zitiert von: 29 — [23] Udo Mahlstedt, Torsten Grüning, Cengiz ¨Ozcan, and. Wilfried Daehn. CONTEST: A Fast ATPG Tool for. Very Lerge Combinational Circuits. In Proceedings. IEEE ... von M Henftling · Zitiert von: 29 — [23] Udo Mahlstedt, Torsten Grüning, Cengiz ¨Ozcan, and. Wilfried Daehn. CONTEST: A Fast ATPG Tool for. Very Lerge Combinational Circuits. In Proceedings. IEEE ...

Bilateral Testing of Nano-scale Fault-tolerant CircuitsInternet Archive Scholar

scholar.archive.org

von L Fang · Zitiert von: 31 — [9] Torsten Grüning, Udo Mahlstedt, and Hartmut Koopmeiners. Diatest: A fast diagnostic test pattern generator for combinational circuits. In Proc ... von L Fang · Zitiert von: 31 — [9] Torsten Grüning, Udo Mahlstedt, and Hartmut Koopmeiners. Diatest: A fast diagnostic test pattern generator for combinational circuits. In Proc ...

a fast diagnostic test pattern generator for combinational circuitsieeecomputer.org

csdl-downloads.ieeecomputer.org

von T Gruning · · Zitiert von: 175 — Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners. Institut für Theoretische Elektrotechnik. Universität HannoverW Hannover 1, Germany. von T Gruning · · Zitiert von: 175 — Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners. Institut für Theoretische Elektrotechnik. Universität HannoverW Hannover 1, Germany.

Udo MahlstedtDBLP

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Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners: DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD 1991: text ...

Hartmut Koopmeinersdblp: computer science bibliography

dblp.org

Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners: DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD 1991: Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners: DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD 1991:

Cengiz ÖzcanDBLP

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— Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan: Accelerated test pattern generation by cone-oriented circuit partitioning.

dblp: Udo Mahlstedt

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List of computer science publications by Udo Mahlstedt

ICCAD - researchr publication

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; Contest: A Fast ATPG Tool for Very Large Combinatorial CircuitsUdo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn. › iccad:1990

Accelerated test pattern generation by cone-oriented circuit...

researchr.org

Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan. Accelerated test pattern generation by cone-oriented circuit partitioning. In Gordon Adshead ...

Analyzing Timing VariationsOUCI

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Torsten Grüning, Udo Mahlstedt, and Hartmut Koopmeiners. DIATEST: A fast diagnostic test pattern generator for combinational circuits. In Proceedings of the ... Torsten Grüning, Udo Mahlstedt, and Hartmut Koopmeiners. DIATEST: A fast diagnostic test pattern generator for combinational circuits. In Proceedings of the ...