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1. Deutsche Meisterschaften der Senioren in Leipzig am 28. und ...www.gymmedia.com › events2000 › natch › GER_Senioren_menB50-55
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Ulrich Kreißig. TV Dresden-Blasewitz SC. 8,30. 8,75. 8,70. 9Horst König. Arterner TV TH. 8,10. 8,85. 8,25. 9, ,65.
Begeisterte Mädchen
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Bei den Junioren kamen beim Vorlauf zur "Deutschen" aufs Treppchen: Marcel Schneider, Moritz Gutheil und Ulrich Kreissig - alle von den ...
Firmen-Mitarbeiter
Kundenbewertungen – Tino Holz e. Kfm. in Dresden - DVAGwww.dvag.de › tino.holz › ueber-uns › alle-bewertungen
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Weiterlesen. Bewertet von: Ulrich Kreißig, Kunde seit ca Tino Holz e. Kfm. Dresden VWL. Ich hatte eine Frage zu einem Schreiben.
Bücher
Höhere Technische Mechanik: Lehr- und Übungsbuch by...
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Save on ISBN Biblio.co.uk has Höhere Technische Mechanik: Lehr- und Übungsbuch by Reiner; Benedix, Ulrich Kreißig and millions of more used,...
Höhere Technische Mechanik von Benedix, Ulrich / Kreißig, Reiner...
www.buch24.de
Moderne Darstellungsformen (Verwendung des Tensorkalküls). Zahlreiche Beispiele mit Lösungen., Lehr- und Übungsbuch, Benedix, Ulrich / Kreißig, Reiner, ...
Ulrich Kreissig | XanEdu Customization Platform
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Author: Ulrich Kreissig. Results. Effect of Ion Energy on Structure and Composition of Cathodic Arc Deposited Alumina Thin Films Springer ...
Höhere Technische Mechanik: Lehr- und Übungsbuch - Reiner Kreißig,...
books.google.de
Mit der vorliegenden Einführung in die Höhere Technische Mechanik, die sich an Studierende der technischen Wissenschaften wendet, soll eine Lücke ...
Dokumente zum Namen
Synthesis and characterization of single-phase epitaxial Cr2N thin ...www.sciencegate.app › documents
www.sciencegate.app
Ulrich Kreissig ◽. Frans Munnik ◽ ... Keyword(s):. Thin Films ◽. Magnetron Sputtering ◽. Mechanical Characterization ◽.
14.5% near-normal incidence reflectance of Cr Sc x-ray multilayer...
opg.optica.org
... of Cr/Sc x-ray multilayer mirrors for the water window. Fredrik Eriksson, Göran A. Johansson, Hans M. Hertz, Eric M. Gullikson, Ulrich Kreissig, and Jens Birch.
Mráz, Stanislav | DeepDyve
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s y ´ Johanna Ros´ n,1,3 Stanislav Mraz,1 Ulrich Kreissig,2 e 1 Denis Music, and Jochen M. Schneider1 Received ...
Veröffentlichungen allgemein
Effect of Ion Energy on Structure and Composition of Cathodic Arc...
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The effect of energy supplied to the growing alumina film on the composition and structure has been investigated by varying substrate temperature and subst
Theoretical and experimental studies related to the compositional and
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Theoretical and experimental studies related to the compositional and microstructural evolution of alumina thin films [Elektronische Ressource] / vorgelegt von...
Performance of the post-focusing mirror system at the reflectometry...
www.wizdom.ai
Fredrik Eriksson, Göran A Johansson, Hans M Hertz, Eric M Gullikson, Ulrich Kreissig, Jens Birch , Optics Letters ...
Artikel & Meinungen
Neutron Depth Profiling - NDP References ( )
www.neutrondepthprofiling.com
... Anna Mackova, Jiri Vacik, Ulrich Kreissig, Frank Eichhorn, Rainer Groetzschel, Optical Materials, Volume 29, Issue 7, March 2007, pp
Sonstiges
NDP References for NIST NDP
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... Anna Mackova, Jiri Vacik, Ulrich Kreissig, Frank Eichhorn, Rainer Groetzschel, Optical Materials, Volume 29, Issue 7, March 2007, pp
ndpreference NIST NDP
sites.google.com
... PAVEL ÈAPEK, MIROSLAVA NOVOTNÁ, JIØÍ VACÍK, ANNA MACKOVÁ, ULRICH KREISSIG, Ceramics − Silikáty, Volume 49, number 2 (2005) pages
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Z-Library single sign on | Z-Library. Download books for free. Find books
Ulrich%20Kreissig?order=filesizeA: مفت ڈاؤنلوڈ. ای بک لائبریری۔...
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Ulrich%20Kreissig?order=filesizeA: مفت ڈاؤنلوڈ. ای بک لائبریری۔ Z-Library پر آن لائن کتابوں کی دکانیں | BookSC. Download books for free. Find books
14.5% near-normal incidence reflectance of Cr/Sc x-ray PubMedpubmed.ncbi.nlm.nih.gov › ...
pubmed.ncbi.nlm.nih.gov
Authors. Fredrik Eriksson , Göran A Johansson, Hans M Hertz, Eric M Gullikson, Ulrich Kreissig, Jens Birch. Affiliation. 1 Thin Film Physics Division, ...
Atomic layer deposition of MgF2 thin films using TaF5 as a novel...
researchportal.helsinki.fi
Atomic layer deposition of MgF2 thin films using TaF5 as a novel fluorine source. Tero Pilvi, Esa Puukilainen, Ulrich Kreissig, Markku Leskelä, Mikko Ritala.
Composition analysis of NdxFeyB thin films by RBS and heavy ion ERDA
www.infona.pl
R. Grötzschel, Michael Mäder, Ulrich Kreissig, Stephan Grigull, Walter Assmann, Stefan Parhofer · Details · Contributors · Fields of science · Bibliography ...
Effect of Ion Energy on Structure and Composition of Cathodic Arc...
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The effect of energy supplied to the growing alumina film on the composition and structure has been investigated by vary...
Interface engineered ultrashort period Cr-Ti multilayers as high ...read.qxmd.com › read › interface-engineered-ultras...
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Fredrik Eriksson, Göran A Johansson, Hans M Hertz, Eric M Gullikson, Ulrich Kreissig, Jens Birch Optics Letters December 15, 28 (24):
Fig. 2 Citation Fredrik Eriksson, Göran A. Johansson, Hans M. Hertz ...
imagebank.osa.org
Fredrik Eriksson, Göran A. Johansson, Hans M. Hertz, Eric M. Gullikson, Ulrich Kreissig, Jens Birch, "14.5% near-normal incidence reflectance of Cr/Sc x-ray ...
Swift Heavy Ions for Materials Engineering and Nanostructuring...
silo.pub
Springer Series inmaterials science145 Springer Series inmaterials science Editors: R. Hull C. Jagadish R.M. Osg...
Radical Enhanced Atomic Layer Deposition of Tantalum Oxide - Thesis...
www.plasma-ald.com
The Plasma Enhanced Atomic Layer Deposition publication database entry for 'Radical Enhanced Atomic Layer Deposition of Tantalum Oxide - Thesis Coverage' at...
OPTICAL LETTERS
www.infomag.ru
... Gran A.Johansson, Hans M.Hertz, Eric M.Gullikson, Ulrich Kreissig, Jens Birch PP $$ LA eng TE Continuous-wave operation of a single-frequency ...
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