Werner Kanert und Reliability - Info zur Person

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ESREF Oral Presentations Tueconference.vde.com › esref › programme › pages

conference.vde.com

Werner Kanert Infineon, Germany Tue-A-10:50. A design tool to study the impact of mission-profile on the reliability of SiC-based PV-inverter devices. Nicolae ...

LinkedIn: Werner Kanert | LinkedIn

Werner Kanerts berufliches Profil anzeigen LinkedIn ist das weltweit größte berufliche Netzwerk, das Fach- und Führungskräften wie Werner Kanert dabei hilft, interne Kontakte zu finden, die mit ... principal reliability, project manager R&D bei KAI GmbH ... Product Reliability and Failure Analysis Engineer at ams AG ... Es fehlt: aviation ‎europe

Physics-of-Failure Based Handbook of Microelectronic Systems -...

books.google.it

Michael Goroll, Reinhard Pufall, Werner Kanert, Boris Plikat, “Semiconductor in High Temperature Applications-A Future trend in Automotive Industry”, Microelectronics Reliability 44, 2004, pp Jeffrey E. Gunn, Sushil K. Malik, “Highly Accelerated Temperature and Humidity Stress Test Techniques”, IEEE/IRPS ...

AEC Q101 Rev C1 Complete | PDF | Reliability EngineeringScribd

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Brian Jendro Siemens VDO Automotive Electronics Corp. Mark A. Kelly Delphi Corporation Werner Kanert Infineon Arthur Chiang Vishay-Siliconix Gary B. Fisher ... › AEC-Q...

Reliability study of copper wire bonding and through silicon viaNanyang Technological University

dr.ntu.edu.sg

— Werner Kanert, my co-supervisor from Infineon Technologies. AG, as well as Mr Lee Kheng Chooi from Infineon Technologies Asia Pacific (IFAP). › bitstream

Jörg Breibach Or Werner Kanert - EasyChaireasychair.org › ESREF2016 › person965

easychair.org

... RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS. PROGRAMINDEXES. Jörg Breibach Or Werner Kanert. Organization: Infineon ...

ESREF Invited Talks

conference.vde.com

Werner Kanert (Infineon, GER) Performance – Reliability Trade-Offs for High-K RRAM Nagarajan Raghavan (Singapore Univ. of Techn. and Design, SIN) Enabling Higher Fault Isolation Resolution through Advanced Optics Derryck Reid (Heriot-Watt University, UK) Reliability of Wafer Level Chip Scale Packages

International Reliability Physics Symposiumzhangqiaokeyan.com

m.zhangqiaokeyan.com

Jiawei Marvin Chan,Chuan Seng Tan,Kheng Chooi Lee,Xu Cheng,Werner Kanert 年/《International Reliability Physics Symposium》 ... › ...

Automotive Electronics Council Component Technical Committee. Agenda....

docplayer.net

... AM - 9:30 AM Horst Lewitschnig Guardbanding Based On Device Drift Behavior KEYNOTE 9:30 AM - 10:00 AM Werner Kanert The Reliability Dilemma :30 AM ...

Dating Failure Rate « Een populaire wereldwijde online datingsite

wereldwijdeonlinedatingsite.logdown.com

Robustness Validation and Failure Rates Sample Sizes in Reliability Testing Werner Kanert Infineon Ren Rongen NXP As a 30 something the ...

Analysis of ESD protection structure behaviour after ageing as new...

www.infona.pl

... after ageing as new approach for system level reliability of automotive power devices. Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu.

Reliability challenges for power devices under active cyclingTypeset

typeset.io

Reliability challenges for power devices under active cycling. Werner Kanert 1• Institutions (1). Infineon Technologies Apr pp › papers

ESREF | TechnicalInformation / InvitedProgramme

www.esref2012.unicas.it

Active cycling reliability of power devices: expectations and limitations. Dr. Werner Kanert Infineon Technologies, Germany ...

TechnicalInformation / Tutorialsunicas.it

www.esref2012.unicas.it

— Reliability issues in automotive microelectronic components and systems. Dr. Werner Kanert Infineon Technologies, Germany. Automotive has a ... › ...

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Werner Kanert und Reliability Person-Info