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New Materials in Memory Development Sub 50 nmWiley
onlinelibrary.wiley.com
von KH Kuesters · · Zitiert von: 39 — Karl Heinz Kuesters, Marc Florian Beug, Uwe Schroeder, Nicolas Nagel, Ulrike Bewersdorff,. Gerald Dallmann, Stefan Jakschik, Roman Knoefler, Stephan Kudelka ... › pdf › adem
Investigation of Program Saturation in Scaled Interpoly Dielectric...
vdocuments.site
1698 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 56, NO. 8, AUGUST Investigation of Program Saturation in Scaled Interpoly Dielectric Floating-Gate Memory...
A new Calibration Set-Up for the Dynamic ...IMEKO
www.imeko.org
von L Klaus · Zitiert von: 2 — A NEW CALIBRATION SET-UP FOR THE DYNAMIC CALIBRATION. OF BRIDGE AMPLIFIERS FROM DC UP TO 10 kHz. Leonard Klaus, M. Florian Beug, and Thomas Bruns. › IMEKO-TC
Informations-Systemtechnik MasterTechnische Universität Braunschweig
www.tu-braunschweig.de
Dr. Florian Beug. Qualifikationsziele: Nach Abschluss des Moduls haben die Studierenden einen Überblick über die Grundlagen sowie die spezifischen. › mhb_ist_msc
NAND Insights Q408
www.forward-insights.com
Florian Beug, Thomas Melde,. Stefan Slesazeck, Gregory Wong. August Page 2. For internal use only. August › ...
Interface state density and barrier height improvement in ...skku.edu
dasan.skku.edu
von K Agrawal · — Florian Beug, Lars Bach, Stephan Riedel, Christoph Ludwig,. Thomas Mikolaijck, Joint Non-volatile Semiconductor Memory Workshop and. › ~ndpl › download
Präzisionsmesstechnik für das elektrisches Messen ...ZwickRoell
www.zwickroell.com
Quelle: “Dynamische Kalibrierung von Brückenverstärkern”, Leonard Klaus (PTB), Florian Beug (PTB), Darmstadt, HBM, HBM: public › testXpo › HBM_ok
Static_and_dynamic_bridge_am...Scribd
www.scribd.com
Florian Beug, Harald Moser, and Günther. Ramm, “Dynamic Bridge Standard for. Strain Gauge Bridge Amplifier Calibration”, Proc. of Conference on Precision › Static-a...
XXII World Congress of the International Measurement ...Proceedings.com
toc.proceedings.com
M. Florian Beug, Harald Moser, Axel Kölling. DEVELOPMENT OF THE NEW 10 N-M DEADWEIGHT TORQUE STANDARD MACHINE IN. CZECH METROLOGY INSTITUTE. › ...
저작자표시-비영리-변경금지 2.0 대한민국 이용자는 아래의 ...snu.ac.kr
s-space.snu.ac.kr
von S Park · · Zitiert von: 3 — Florian Beug, Thomas Melde, Jan Paul, Roman Knoefer, “TaN and. Al2O3 Sidewall Gate-Etch Damage Influence on Program, Erase, and. Retention of Sub-50nm TANOS ... › bitstream
Elektrotechnik (BPO 2020) Master
www.tu-braunschweig.de
— Dr. Florian Beug. Qualifikationsziele: Nach Abschluss des Moduls haben die Studierenden einen Überblick über die Grundlagen sowie die ... › fileadmin › et_msc
Reliability Study of the Floating Gate Based Embedded ...tudelft.nl
repository.tudelft.nl
— [4.1] R. Duane, M. Florian Beug, and A. Mathewson, “Novel Capacitance Coupling Coefficient. Measurement Methodology for Floating Gate ... › OBJ › download
Accurate program simulation of TANOS charge trapping devices - IEEE...
www.ieeeexplore.ws
This publication investigates the program simulation of charge trapping memory devices in detail. Three different aspects of the simulation are highlighted
New Materials in Memory Development Sub 50 nm: Trends in Flash and...
www.deepdyve.com
Unfortunately, an in…ct reference list was processed. The …ct version of the reference list is shown below. We would like to apologize for any...
(PDF) New Materials in Memory Development Sub 50 nm: Trends in Flash...
pdfslide.us
lo hr e * Tech. Dig Sanghun Jeon, Jongsun Sel, Jintaek Park, Kihwan Choi, Taehwa Yoo, Jaesung Sim, Kinam Kim, IEDM Tech. Dig , 29. [7]...
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