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Planarization of Silicon Dioxide and Silicon Nitride ...IOPscience
iopscience.iop.org
von A Sheikholeslami · · Zitiert von: 3 — Planarization of Silicon Dioxide and Silicon Nitride Passivation Layers, Alireza Sheikholeslami, Farnaz Parhami, Helmut Puchner, Siegfried Selberherr. von A Sheikholeslami · · Zitiert von: 3 — Planarization of Silicon Dioxide and Silicon Nitride Passivation Layers, Alireza Sheikholeslami, Farnaz Parhami, Helmut Puchner, Siegfried Selberherr.
Microelectronics Reliability | Vol 108, May 2020ScienceDirect.com
www.sciencedirect.com
Radiation induced soft errors in 16 nm floating gate SLC NAND flash memory. Sandhya Chandrashekhar, Helmut Puchner, Jun Mitani, Satoshi Shinozaki, ... David ... Radiation induced soft errors in 16 nm floating gate SLC NAND flash memory. Sandhya Chandrashekhar, Helmut Puchner, Jun Mitani, Satoshi Shinozaki, ... David ...
Statistical Anomalies of Bitflips in SRAMs to Discriminate ...Archive ouverte HAL
hal.science
von JA Clemente · · Zitiert von: 27 — ... Helmut Puchner (3) , G. Hubert (4) , Raoul Velazco (5). Afficher plus de détails. 1 UCM - Department of Computer Architecture and Automatic [Madrid] 2 LPSC ... von JA Clemente · · Zitiert von: 27 — ... Helmut Puchner (3) , G. Hubert (4) , Raoul Velazco (5). Afficher plus de détails. 1 UCM - Department of Computer Architecture and Automatic [Madrid] 2 LPSC ...
Radiation induced soft errors in 16 nm floating gate SLC ...ScienceDirect.com
www.sciencedirect.com
von S Chandrashekhar · · Zitiert von: 7 — Helmut Puchner a , Jun Mitani a , Satoshi Shinozaki b , Mohamed Sardi ... Helmut Puchner:Resources, Supervision, Writing - review & editing.Jun Mitani ... von S Chandrashekhar · · Zitiert von: 7 — Helmut Puchner a , Jun Mitani a , Satoshi Shinozaki b , Mohamed Sardi ... Helmut Puchner:Resources, Supervision, Writing - review & editing.Jun Mitani ...
C. CaiDBLP
dblp.org
— Y. Z. Xu, O. Pohland, C. Cai, Helmut Puchner: Leakage Increase of Narrow and Short BCPMOS. ISQED 2004: ; — Y. Z. Xu, O. Pohland, C. Cai, Helmut Puchner: Leakage Increase of Narrow and Short BCPMOS. ISQED 2004: ;
Helmut PuchnerDBLP
dblp.org
— List of computer science publications by Helmut Puchner — List of computer science publications by Helmut Puchner.
Neutron-induced effects on a self-refresh DRAMScienceDirect
www.sciencedirect.com
von LM Luza · · Zitiert von: 5 — Helmut Puchner c , Rubén García Alía d , Manon Letiche e , Carlo Cazzaniga f ... Helmut Puchner: Validation. Rubén García Alía: Validation. Manon Letiche ...
Multiple Cell Upset Classification in Commercial SRAMsArchive ouverte HAL
hal.science
von G Tsiligiannis · · Zitiert von: 63 — ... Helmut Puchner , Christopher Frost (3, 1) , Frédéric Wrobel (4, 5) , Frédéric Saigné (4, 5). Afficher plus de détails. 1 TEST - Test and dEpendability of ...
dblp: International Symposium on Quality Electronic Design 2004
dblp.uni-trier.de
Bibliographic content of International Symposium on Quality Electronic Design 2004
F. Duan - dblpdblp.org › Persons
dblp.org
Helmut Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti: Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectron.
dblp: BibTeX records: Helmut Puchner
dblp.uni-trier.de
List of computer science publications by BibTeX records: Helmut Puchner
Statistical Deviations from the Theoretical only-SBU Model ...Archive ouverte HAL
hal.science
von FJ Franco · · Zitiert von: 13 — ... Helmut Puchner , Guillaume Hubert (2) , Raoul Velazco (3). Afficher plus de détails. 1 LPSC - Laboratoire de Physique Subatomique et de Cosmologie 2 ONERA ...
Y. Z. XuDBLP
dblp.org
— persistent URL: https://dblp.org/rec/conf/isqed/XuPCP04. Y. Z. Xu, O. Pohland, C. Cai, Helmut Puchner: Leakage Increase of Narrow and Short ...
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