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Defect-engineered (Ti,Al)N thin filmsbooks.google.com › books
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H. Högberg, L. Hultman, J. Emmerlich, T. Joelsson, P. Eklund, J. M. MolinaAldareguia, J. P. Palmquist, O. Wilhelmsson, and U. Jansson, ...
Defect-engineered (Ti,Al)N thin films - Isabella Citlalli Schramm...
books.google.hr
[42] [43] [44] [45] [46] [47] [48] [49] [50] [51] [52] [53] [54] [55] [56] [57] J. Emmerlich , D. Music, P. Eklund, O. Wilhelmsson, U. Jansson, J. M. Schneider, H. Högberg ...
Plasma Science and Technology for Emerging Economies: An AAAPT...
books.google.hr
13, 371–374 (2004) P. Eklund, J. Emmerlich, H. Hogberg, O. Wilhelmsson, P. Isberg, J. Birch, R.O.A. Persson, U. Jansson, L. Hultman, Structural, electrical, and ...
High-power impulse magnetron sputtering of Ti-Si-C thin films from a...
liu.diva-portal.org
Original publication: J. Alami, P. Eklund, J. Emmerlich, O. Wilhelmsson, U. Jansson, H. Högberg, L. Hultman, & U. Helmersson, High-power impulse magnetron ...
Electronic structure investigation of Ti3AlC2, Ti3SiC2, and Ti3GeC2 ...arxiv.org › cond-mat
arxiv.org
AP · Authors:M. Magnuson, J. -P. Palmquist, M. Mattesini, S. Li, R. Ahuja, O. Eriksson, J. Emmerlich, O. Wilhelmsson, P. Eklund, H. Högberg, ...
Phys. Rev. B 70, (2004) - ${M}_{n+1}A{X}_{n}$ phases in the...
journals.aps.org
J.-P. Palmquist, S. Li, P. O. Å. Persson, J. Emmerlich, O. Wilhelmsson, H. Högberg, M. I. Katsnelson, B. Johansson, R. Ahuja, O. Eriksson, ...
[PDF] Electronic structure investigation of Ti3AlC2, Ti3SiC2, and Ti3GeC2 ...www.diva-portal.org › smash › get › diva2: › FULLTEXT01
www.diva-portal.org
M. Magnuson,1 J.-P. Palmquist,2 M. Mattesini,1,4 S. Li,1 R. Ahuja,1 O. Eriksson,1 J. Emmerlich,3 O. Wilhelmsson,2. P. Eklund,3 H. Högberg,3 L. Hultman,3 and ...
Wikipedia: Hochleistungsimpulsmagnetronsputtern – Wikipedia
Das Hochenergieimpulsmagnetronsputtern (englisch high power impulse magnetron J. Alami, P. Eklund, J. Emmerlich, O. Wilhelmsson, U. Jansson, H. Högberg, L. Hultman, U. Helmersson: High-power impulse magnetron sputtering of ...
Effect of Si and C concentration on the microstructure, and the ...aip.scitation.org › doi › abs
aip.scitation.org
J. Alami, P. Eklund, J. Emmerlich, O. Wilhelmsson, U. Jansson, H. Hogberg, L. Hultman, and U. Helmersson, Thin Solid Films 515, (2006).
Growth and characterization of MAX-phase thin films - Academia.eduwww.academia.edu › Growth_and_characterization_...
www.academia.edu
Persson, J. Emmerlich, O. Wilhelmsson, H. Hfgberg, M. Katsnelsson, B. Johansson, R. Ahuja, O. Eriksson, L. [1] ...
Influence of Substrate Temperature on the TiC Thin Films Prepared ...koreascience.kr › article › JAKO
koreascience.kr
https://doi.org s ; P. Eklund, J. Emmerlich, H. Hogberg, O. Wilhelmsson, P. Isberg, J. Birch, P.O.Å. Persson, U. Jansson, ...
Per Eklund: H-index & Awards - Academic Profile | Research.comresearch.com › Materials Science
research.com
Ola Wilhelmsson;Jens-Petter Palmquist;Erik Lewin;J. Emmerlich. Journal of Crystal Growth (2006) Citations. Element Replacement Approach by Reaction ...
Phys. Rev. B 70, (2004) - ${M}_{n+1}A{X}_{n}$ phases in ...link.aps.org › doi › PhysRevB
link.aps.org
AP · J.-P. Palmquist, S. Li, P. O. Å. Persson, J. Emmerlich, O. Wilhelmsson, H. Högberg, M. I. Katsnelson, B. Johansson, R. Ahuja, O. Eriksson, L.
[PDF] Optical properties of Ti3SiC2 and Ti4AlN3 - VCU Scholars Compassscholarscompass.vcu.edu › cgi › viewcontent
scholarscompass.vcu.edu
Persson, J. Emmerlich, O. Wilhelmsson, H. Hogberg, M. I. Katsnelson, B. Johansson, R. Ahuja, O. Eriksson, L ...
grupo de investigación sismicidad, sismotectónica y riesgo sísmicowww.ucm.es › gsismo › publicaciones
www.ucm.es
Eriksson, J. Emmerlich, O. Wilhelmsson, P. Eklund, H. Högberg, L. Hultman, and U. Jansson (2005). Electronic structure investigation of ...
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