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Dielectrics for Nanosystems 4: Materials Science, Processing,...

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This issue of ECS Transactions outlines the dielectric issues in all areas of nanosystems including the traditional areas of semiconductor processing and...

From Contamination to Defects, Faults and Yield Loss: Simulation and...

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D. Schmitt-Landsiedel, J. Winnerl, G. Neuendorf and J. Koelzer, “Use of a CMOS Static Memory Array as a Technology Test Vehicle,” Quality and Reliability ...

Latchup - Steven H. Voldman - Google Books

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International Electron Device Meeting (IEDM) Technical Digest, p. 731– D. Takacs, J. Harter, E.P. Jacobs, C. Werner, U. Schwabe, J. Winnerl and E.

Management, a Bibliography for NASA Managers - Google Books

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PROGRESS IN SUBMICRON TECHNOLOGIES K. MERTEN and J. WINNERL In ESA , ESA Electronic Components Conference p Mar Copyright ...

Management - Google Books

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... N :# Siemens A.G., Munich (Germany, F.R.). PROGRESS IN SUBMICRON TECHNOLOGIES K. MERTEN and J. WINNERL In ESA, ESA Electronic ...

Münchner Intelligenzblatt: Bayern - Google Books

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J. Winnerl von München I. Ph. Miller von München Mar. Kli: ger von München I. Jn der 1. RheForik J. Ba um iller von Matheu CTJ. B. Hard von München ...

New Insulators Devices and Radiation Effects - Google Books

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Silicon technology today forms the basis of a world-wide, multi-billion dollar component industry. The reason for this expansion can be found not only in the...

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Bücher J. Winnerl

Dielectrics for Nanosystems 4: Materials Science, Processing,...

From Contamination to Defects, Faults and Yield Loss: Simulation and...

Latchup - Steven H. Voldman - Google Books

Management, a Bibliography for NASA Managers - Google Books

Management - Google Books

Münchner Intelligenzblatt: Bayern - Google Books

New Insulators Devices and Radiation Effects - Google Books