Jan-Erik Schmutz und Hendrik Hölscher - Info zur Person

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Bharat Bhushan (eds.)VDOC.PUB

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Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer (auth.), Bharat Bhushan (eds.) 10,630; 4,965. Preview Document ...

Scanning Probe Microscopy in Nanoscience and Ellibsellibs.com

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Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer, Boris Anczykowski. 2. Photonic Force Microscopy: From Femtonewton Force Sensing to ...

Scanning Probe Microscopy of Functional Materials | Ebook ...

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Hendrik Hölscher, Jan-Erik Schmutz, Udo D. Schwarz. 4. Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy ...

Scanning Probe Microscopy in Nanoscience and Nanotechnologygoogle.be

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1 Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, ...

Single-Nanoparticle-Terminated Tips for Scanning Probe ...American Chemical Society

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von IU Vakarelski · · Zitiert von: 100 — 2008,,, https://doi.org B ; Jan-Erik Schmutz, Marcus M. Schäfer, Hendrik Hölscher.

(O) Overview of Invited Talks and Sessions - The NOMAD ...th.fhi-berlin.mpg.de › DPG-FV-O-2008_program

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•Jan-Erik Schmutz, Marcus M. Schäfer, and Hendrik Hölscher. — CeNTech, Universität MünsterMünster,. Germany. In some areas of ...

O - DPG-VerhandlungenYumpu

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— •Jens Falter, Jan-Erik Schmutz, Daniel. Ebeling, Marcus Schäfer und Hendrik Hölscher — Center for.

Scanning Probe Microscopy of Functional Materials | SpringerLink

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Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications. Hendrik Hölscher, Jan-Erik Schmutz, Udo D. Schwarz. Pages

Alle Infos zum Namen "Jan-Erik Schmutz"

WO A1 - Colloid-sensor for afm Google Patents

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Download PDF Find Prior Art Similar. Other languages: English: French; Inventor: Marcus Matthias SCHÄFER: Jan-Erik Schmutz: Hendrik Hölscher ...

Jan-Erik Schmutz

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Search results for: Jan-Erik Schmutz ... Hendrik Hölscher, Jan-Erik Schmutz, Udo Schwarz · Scanning Probe Microscopy of Functional Materials > Dynamic ...

Colloid probes with increased tip height for higher ...National Institutes of Health (.gov)

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von JE Schmutz · · Zitiert von: 9 — Authors. Jan-Erik Schmutz , Marcus M Schäfer, Hendrik Hölscher. Affiliation. 1 Center for Nanotechnology (CeNTech)Münster, ...

2 nd International Workshop on Advanced Atomic Force ...docplayer.net › nd-in...

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... Dynamic Force Microscopy Tobias Meier 1, Özhan Ünverdi 1, Jan-Erik Schmutz 2 and Hendrik Hölscher 1 1 Karlsruhe Institute of Technology (KIT), Germany, ...

Scanning Probe Microscopy of Functional Materials ...epdf.pub › scanning-probe-micros...

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Hendrik Hölscher, Jan-Erik Schmutz, and Udo D. Schwarz Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy ...

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