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GaN Marathon PowerBase-Enhanced substrates and GaN pilot lines...
www.powerbase-project.eu
... Quay (Fraunhofer IAF), Steve Stoffels (imec), Huili Grace Xing (Cornell University), Andreas Waag (TU Braunschweig), Joachim Wuerfl (FBH).
Optical Device Failure Analysis | FIB, SEM | EAG Laboratories
www.eag.com
Instructors: Leonard Brillson, The Ohio State University, Matteo Meneghini, University of Padova, Joachim Würfl, Ferdinand-Braun-Institut, Leibniz Institut ... › news › eag-...
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