Joan Figueras - Wissenschaftliche Veröffentlichungen

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Indirect test of M-S circuits using multiple specification band...

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Joan Figueras received his Industrial Engineering degree from Universitat Politècnica de Catalunya (UPC), Barcelona, Spain, and the M.Sc. and Ph.D. degrees ...

dblp: IEEE VLSI Test Symposium 1995

dblp.uni-trier.de

Bibliographic content of IEEE VLSI Test Symposium 1995

dblp: Joan Figueras

dblp.dagstuhl.de

List of computer science publications by Joan Figueras

dblp: Integration, Volume 26

dblp.uni-trier.de

Bibliographic content of Integration, Volume 26

dblp: Journal of Electronic Testing, Volume 14

dblp.uni-trier.de

Bibliographic content of Journal of Electronic Testing, Volume 14

12th IEEE European Test Symposium

ets07.informatik.uni-freiburg.de

Joan Figueras : UPC, ES - Carsten Wegener : Infineon, DE. Probing Challenges for Next Generation SoC Devices Sergio PEREZ : FormFactor, USA. New Low ...

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Wissenschaftliche Veröffentlichungen Joan Figueras

Indirect test of M-S circuits using multiple specification band...

dblp: IEEE VLSI Test Symposium 1995

dblp: Joan Figueras

dblp: Integration, Volume 26

dblp: Journal of Electronic Testing, Volume 14

12th IEEE European Test Symposium