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Bücher von Gnauck – gebraucht, antiquarisch & neu kaufenBooklooker
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-Kleben und Schweißen-. Fründt, Peter / Gnauck, Bernhardt. Verlagsgesellschaft Rudolf Müller. , 1976, Paperback ISBN: Zustand: leichte ...
„Peter Bernhardt“ – Bücher gebraucht, antiquarisch & neu ...Booklooker
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Fründt, Peter / Gnauck, Bernhardt. Verlagsgesellschaft Rudolf Müller. , 1976, Paperback ISBN: Zustand: leichte Gebrauchsspuren. 9,80 € 2,
Introduction to Focused Ion Beams | Ebook | Ellibs Ebookstore
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Ellibs Ebookstore - Ebook: Introduction to Focused Ion Beams - Author: Giannuzzi, Lucille A. - Price: 84,65€
Introduction to Focused Ion Beams | E-bok | Ellibs E-bokhandelellibs.com
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7. High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy Peter Gnauck, Peter Hoffrogge, M. Schumann. 8. FIB for Materials Science ...
A Practical Guide to Scanning Electron Microscopy in the ...google.de
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... Dr. Peter Gnauck, Dr. Fabián PérezWillard, Dr. Andreas Schertel, and Dr. Ulrike Zeile, for countless discussions, suggestions, assistance, and ix.
Focused Ion Beam Systems: Basics and Applicationsgoogle.de
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Contributors from Zeiss on the FIB EBSD project include Peter Gnauck, Hidde Wallart, and David Hubbard. Other Zeiss contributors to the overall 3D ...
Introduction to Focused Ion Beams: Instrumentation, Theory, ...google.de
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Ron Anderson, Microscopy Today Derren N. Dunn, IBM Lucille A. Giannuzzi, FEI Company Peter Gnauck, Carl Zeiss SMT, Inc. Dieter P. Griffis, North Carolina ...
Practical Metallography Band 43 Heft 8
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Frank Altmann, Andreas Graff, Michél Simon, Himar Hoffmeister, Peter Gnauck May 9, Page range: More Cite Access restricted Content is ...
TEM-Präparation mittels „low-voltage“-FIBDe Gruyter
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von F Altmann · · Zitiert von: 9 — and Peter Gnauck. Peter Gnauck. Carl Zeiss NTS GmbHD Oberkochen. Search for this author in:.
Practical Metallography Band 43 Heft 8De Gruyter
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Inhalt ; Gunter Benkißer, Michael Pohl, Christian Heßing. Seiten: ; Frank Altmann, Andreas Graff, Michél Simon, Himar Hoffmeister, Peter Gnauck. Seiten: ...
Microelectronics Failure Analysis: Desk Referencegoogle.de
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Private communication, Peter Gnauck, LEO Electron Microscopy GmbH. 8. Goldstein, etal., p Available from Small World LLC, Chestertown Drive, ...
Istfa 2003: Proceedings of the 29Th International Symposium for...
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... Materials Scientists, and Geologists, 2nd Edition, Plenum, New York, 1992, p Private communication, Peter Gnauck, LEO Electron Microscopy GmbH.
Microelectronics Failure Analysis: Desk Reference - EDFAS Desk...
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Includes bibliographical references and index.
Practical Metallography Volume 43 Issue 8De Gruyter
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Contents ; Gunter Benkißer, Michael Pohl, Christian Heßing. Page range: ; Frank Altmann, Andreas Graff, Michél Simon, Himar Hoffmeister, Peter Gnauck.
Official Gazette of the United States Patent and Trademark Office:...
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... Tübingen , and Peter Gnauck , Reutlingen , both of Germany , assignors to NMI Naturwissenschaftliches und Medizinisches , Germany 132 PCT No.
Entwicklung einer niederenergetischen Flüssigmetall-Rasterionensonde...
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... niederenergetischen Flüssigmetall-Rasterionensonde für die in-situ Ionenätzung im Transmissionselektronenmikroskop (TEM). Front Cover. Peter Gnauck.
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