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Kruit, Pieter
eb-info.eu
Die eb Elektrische Bahnen - Elektrotechnik im Verkehrswesen ist eine seit erscheinende technisch-wissenschaftliche Eisenbahn-Fachzeitschrift zu den Themen...
2.5 million for fast electron microscopy
www.cursor.tue.nl
FOM has accepted the Industrial Partnership Program 'The Foundations for Faster Electron Microscopy’. Eindhoven researchers dr.ir. Seth Brussaard, prof.dr.ir.
Gordon and Betty Moore Foundation Awards $4 Million for Quantum...
philanthropynewsdigest.org
The grant will provide support for an international effort to demonstrate interaction-free measurements with electrons — which, if successful, would form the...
The future of chip manufacturing | MIT News | Massachusetts Institute...
news.mit.edu
MIT researchers show how to make e-beam lithography, commonly used to prototype computer chips, more practical as a mass-production technique.
NWO grant of 17 million awarded to the Netherlands Electron...
www.necen.nl
From left to right: Pieter Kruit (TU Delft), Bram Koster (LUMC, NeCEN), Judith Klumperman (UMC Utrecht), Ron Heeren (Maastricht) ...
history oftrends.isibrno.cz/history/third/
trends.isibrno.cz
Pieter Kruit: Methods to measure amplitude and phase of the exit wave in TEM. Armin Delong: Low energy TEM. Vladimír Kolaøík: TEM for surface examination.
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