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Hrishikesh Das | Mississippi State University | 23 PublicationsAI Chat for scientific PDFs | SciSpace

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Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations · Sara Kochoska, ... Sara Kochoska,Martin ... Pulsed Forward Bias Body Diode Stress of V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations · Sara Kochoska, ... Sara Kochoska,Martin ...

Conference Programicscrm 2023

icscrm-2023.org

— Mo.C.7 Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham,. Swapna Sunkari, Joshua Justice and Hrishikesh Das — Mo.C.7 Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham,. Swapna Sunkari, Joshua Justice and Hrishikesh Das ...

Top 334 Materials Science Forum papers published in 2023AI Chat for scientific PDFs | SciSpace

typeset.io

Sara Kochoska, Martin Domeij, Thanh-Toan Pham, S. Maslougkas, Swapna Sunkari, J. Justice, Hrishikesh Das - Show less +3 more. 04 Jun Materials Science ... Sara Kochoska, Martin Domeij, Thanh-Toan Pham, S. Maslougkas, Swapna Sunkari, J. Justice, Hrishikesh Das - Show less +3 more. 04 Jun Materials Science ...

Effects of Basal Plane Dislocations on SiC Power Device ReliabilityOUCI

ouci.dntb.gov.ua

Sara Kochoska, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. https://doi.org p-52e Sara Kochoska, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. https://doi.org p-52e

ON Semiconductor | Phoenix, United States |ResearchGate

www.researchgate.net

Sara Kochoska · Martin Domeij · Thanh Toan Pham; [...] Hrishikesh Das. Bipolar degradation is a known ... Sara Kochoska · Martin Domeij · Thanh Toan Pham; [...] Hrishikesh Das. Bipolar degradation is a known ...

ProgramEasyChair

easychair.org

Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham, Swapna Sunkari, Joshua Justice and Hrishikesh Das. Body diode reliability ... Sara Kochoska, Jimmy Franch, Sotirios Maslougkas, Martin Domeij, Thanh-Toan Pham, Swapna Sunkari, Joshua Justice and Hrishikesh Das. Body diode reliability ...

Pulsed Forward Bias Body Diode Stress of v SiC ...Scientific.net

www.scientific.net

von S Kochoska · — Sara Kochoska*, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. Keywords: 4H-SiC, Basal Plane ... von S Kochoska · — Sara Kochoska*, Martin Domeij, Thanh Toan Pham, Sotirios Maslougkas, Swapna Sunkari, Joshua Justice, Hrishikesh Das. Keywords: 4H-SiC, Basal Plane ...

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