Sreenivas Gangadhar - Veröffentlichungen allgemein

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A Probabilistic Approach to Diagnose SETs in Sequential Circuits |...

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In recent work, the error latching probability due to an SET is calculated for a single observable point, and this help in hardening the design. This paper

sreenivasgangadharburra Publisher Publications - Issuu

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Sreenivas Gangadhar Burra. Prasanthi Nilayam, US. Publications (0) · Stacks (0) · Followers (0). Show Stories inside. New. —. Issuu company logo.

16th IEEE International On-Line Testing Symposium (IOLTS 2010), researchr.org › publication › iolts-2010

researchr.org

[doi] · Probabilistic methods for the impact of an SET in combinational logicSreenivas Gangadhar, Spyros Tragoudas [doi] · Analysis of on-line ...

Non-enumerative generation of statistical path delays for ATPG -...

researchr.org

Sreenivas Gangadhar. This author has not been identified. Look up 'Sreenivas Gangadhar' in Google · Rathish Jayabharathi. This author has not been identified ...

A Probabilistic Approach to Diagnose SETs in Sequential Circuits -...

researchr.org

@article{GangadharT13, title = {A Probabilistic Approach to Diagnose SETs in Sequential Circuits}, author = {Sreenivas Gangadhar and Spyros Tragoudas}, ...

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Veröffentlichungen allgemein Sreenivas Gangadhar

A Probabilistic Approach to Diagnose SETs in Sequential Circuits |...

sreenivasgangadharburra Publisher Publications - Issuu

16th IEEE International On-Line Testing Symposium (IOLTS 2010), researchr.org › publication › iolts-2010

Non-enumerative generation of statistical path delays for ATPG -...

A Probabilistic Approach to Diagnose SETs in Sequential Circuits -...